Freescale Semiconductor MCF52210, MCF52211, MCF52212, MCF52213 29.4.3.1 IDCODE Instruction, 29.4.3.2 SAMPLE/PRELOAD Instruction, 29.4.3.3 EXTEST Instruction

IEEE 1149.1 Test Access Port (JTAG)
MCF52211 ColdFire® Integrated Microcontroller Reference Manual, Rev. 2
29-8 Freescale Semiconductor
29.4.3.1 IDCODE Instruction
The IDCODE instruction selects the 32-bit IDCODE register for connection as a shift path between the
TDI and TDO pin. This instruction allows interrogation of the MCU to determine its version number and
other part identification data. The shift register lsb is forced to logic 1 on the rising edge of TCLK
following entry into the capture-DR state. Therefore, the first bit to be shifted out after selecting the
IDCODE register is always a logic 1. The remaining 31 bits are also forced to fixed values on the rising
edge of TCLK following entry into the capture-DR state.
IDCODE is the default instruction placed into the instruction register when the TAP resets. Thus, after a
TAP reset, the IDCODE register is selected automatically.
29.4.3.2 SAMPLE/PRELOAD Instruction
The SAMPLE/PRELOAD instruction has two functions:
• SAMPLE - obtain a sample of the system data and control signals present at the MCU input pins
and before the boundary scan cell at the output pins. This sampling occurs on the rising edge of
TCLK in the capture-DR state when the IR contains th e $2 opcode. The sampled data is accessible
by shifting it through the boundary scan register to the TDO output by using the shift-DR state. The
data capture and the shift operation are transparent to system operation.
NOTE
External synchronization is required to achieve meaningful results because
there is no internal synchronization between TCLK and the system clock.
• PRELOAD - initialize the boundary scan register update cells before selecting EXTEST or
CLAMP. This is achieved by ignoring the data shifting out on the TDO pin and shifting in
initialization data. The update-DR state and the falling edge of TCLK can then transfer this data to
the update cells. The data is applied to the external output pins by the EXTEST or CLAMP
instruction.
29.4.3.3 EXTEST Instruction
The external test (EXTEST) instruction selects the boundary scan register. It forces all output pins and
bidirectional pins configured as outputs to the values preloaded with the SAMPLE/PRELOAD instruction
HIGHZ 1001 Selects bypass register while tri-stating all output pins and asserting
functional reset
CLAMP 1100 Selects bypass while applying fixed values to output pins and asserting
functional reset
BYPASS 1111 Selects bypass register for data operations
Reserved all others1Decoded to select bypass register
1Freescale reserves the right to change the decoding of the unused opcodes in the future.
Table 29-5. JTAG Instructions (continued)
Instruction IR[3:0] Instruction Summary