Hitachi HTS541640J9SA00 Self-test log data structure, Selective self-test log data structure

Travelstar 5K160 (SATA) Hard Disk Drive Specification

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Figure 92 Error data structure

State field contains a value indicating the device state when command was issued to the device.

Value	State
x0h	Unknown
x1h	Sleep
x2h	Standby
x3h	Active/Idle
x4h	S.M.A.R.T. Off-line or Self-test
x5h-xAh	Reserved
xBh-xFh	Vendor specific
	Note: The value of x is vendor specific.

14.40.6Self-test log data structure

The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering.

Description	Bytes	Offset
Data structure revision	2	00h
Self-test number	1	n*18h+02h
Self-test execution status	1	n*18h+03h
Life time power on hours	2	n*18h+04h
Self-test failure check point	1	n*18h+06h
LBA of first failure	4	n*18h+07h
Vendor specific	15	n*18h+0Bh
...
Vendor specific	2	1FAh
Self-test log pointer	1	1FCh
Reserved	2	1FDh
Data structure checksum	1	1FFh
	512

Note: n is 0 through 20

Figure 93 Self-test log data structure

The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors.

After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new descriptor.

Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is descriptor(s) the value is 1 through 21.

14.40.7Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering.

Description	Bytes	Offset	Read/Write
Data structure revision	2	00h	R/W
Starting LBA for test span 1	8	02h	R/W
Ending LBA for test span 1	8	0Ah	R/W

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