Travelstar 5K160 (SATA) Hard Disk Drive Specification

30

Figure 92 Error data structure

State field contains a value indicating the device state when command was issued to the device.

Value

State

x0h

Unknown

x1h

Sleep

x2h

Standby

x3h

Active/Idle

x4h

S.M.A.R.T. Off-line or Self-test

x5h-xAh

Reserved

xBh-xFh

Vendor specific

 

Note: The value of x is vendor specific.

14.40.6Self-test log data structure

The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering.

Description

Bytes

Offset

 

Data structure revision

2

00h

 

Self-test number

1

n*18h+02h

 

Self-test execution status

1

n*18h+03h

 

Life time power on hours

2

n*18h+04h

 

Self-test failure check point

1

n*18h+06h

 

LBA of first failure

4

n*18h+07h

 

Vendor specific

15

n*18h+0Bh

 

...

 

 

 

Vendor specific

2

1FAh

 

Self-test log pointer

1

1FCh

 

Reserved

2

1FDh

 

Data structure checksum

1

1FFh

 

 

512

 

 

Note: n is 0 through 20

Figure 93 Self-test log data structure

The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors.

After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new descriptor.

Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is descriptor(s) the value is 1 through 21.

14.40.7Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering.

Description

Bytes

Offset

Read/Write

Data structure revision

2

00h

R/W

Starting LBA for test span 1

8

02h

R/W

Ending LBA for test span 1

8

0Ah

R/W

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Hitachi HTS541640J9SA00, HTS541680J9SA00 manual Self-test log data structure, Selective self-test log data structure

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