Hitachi HTS541680J9SA00 Extended Self-test log sector, Device error count, Value, State, x5h-xAh

Travelstar 5K160 (SATA) Hard Disk Drive Specification

Error register		1	01h
Sector count register (7:0)	(see Note)	1	02h
Sector count register (15:8)	(see Note)	1	03h
Sector number register (7:0)		1	04h
Sector number register (15:8)		1	05h
Cylinder Low register (7:0)		1	06h
Cylinder Low register (15:8)		1	07h
Cylinder High register (7:0)		1	08h
Cylinder High register (15:8)		1	09h
Device register		1	0Ah
Status register		1	0Bh
Extended error data (vendor specific)		19	0Ch
State		1	1Fh
Life timestamp (hours)		2	20h
		34

Note: bits (7:0) refer to the contents if the register is read with bit 7 of the Device Control register cleared to zero. Bits (15:8) refer to the contents if the register is read with bit 7 of the Device Control register set to one.

Figure 55 Error data structure

State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below.

Value	State
x0h	Unknown
x1h	Sleep
x2h	Standby
x3h	Active/Idle
x4h	SMART Off-line or Self-test
x5h-xAh	Reserved
xBh-xFh	Vendor specific
	Note: The value of x is vendor specific.

14.16.2.4Device error count

This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged.

14.16.3Extended Self-test log sector

Figure 56 defines the format of each of the sectors that comprise the Extended SMART self-test log.

The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be included in the Extended SMART self-test log with all 48-bit entries.

Description	Bytes	Offset
Self-test log data structure revision number	1	00h
Reserved	1	01h
Self-test descriptor index (7:0)	1	02h
Self-test descriptor index (15:8)	1	03h

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