Travelstar 5K160 (SATA) Hard Disk Drive Specification

Error register

 

1

01h

Sector count register (7:0)

(see Note)

1

02h

Sector count register (15:8)

(see Note)

1

03h

Sector number register (7:0)

 

1

04h

Sector number register (15:8)

1

05h

Cylinder Low register (7:0)

 

1

06h

Cylinder Low register (15:8)

 

1

07h

Cylinder High register (7:0)

 

1

08h

Cylinder High register (15:8)

1

09h

Device register

 

1

0Ah

Status register

 

1

0Bh

Extended error data (vendor specific)

19

0Ch

State

 

1

1Fh

Life timestamp (hours)

 

2

20h

 

 

34

 

Note: bits (7:0) refer to the contents if the register is read with bit 7 of the Device Control register cleared to zero. Bits (15:8) refer to the contents if the register is read with bit 7 of the Device Control register set to one.

Figure 55 Error data structure

State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below.

Value

State

x0h

Unknown

x1h

Sleep

x2h

Standby

x3h

Active/Idle

x4h

SMART Off-line or Self-test

x5h-xAh

Reserved

xBh-xFh

Vendor specific

 

Note: The value of x is vendor specific.

14.16.2.4Device error count

This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged.

14.16.3Extended Self-test log sector

Figure 56 defines the format of each of the sectors that comprise the Extended SMART self-test log.

The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be included in the Extended SMART self-test log with all 48-bit entries.

Description

Bytes

Offset

Self-test log data structure revision number

1

00h

Reserved

1

01h

Self-test descriptor index (7:0)

1

02h

Self-test descriptor index (15:8)

1

03h

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HTS541640J9SA00, HTS541616J9SA00, HTS541680J9SA00, HTS541612J9SA00, HTS541660J9SA00 specifications

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