EM78P259N/260N

8-Bit Microprocessor with OTP ROM

C Quality Assurance and Reliability

Test Category

Test Conditions

Remarks

Solderability

Solder temperature=245±5°C, for 5 seconds up to the

 

stopper using a rosin-type flux

 

 

 

 

 

 

 

Step 1: TCT, 65°C (15mins)~150°C (15mins), 10 cycles

 

 

Step 2: Bake at 125°C, TD (durance)=24 hrs

 

 

Step 3: Soak at 30°C/60%TD (durance)=192 hrs

For SMD IC (such as

Pre-condition

 

Step 4: IR flow 3 cycles

SOP, QFP, SOJ, etc)

 

(Pkg thickness ≥ 2.5mm or

 

 

 

Pkg volume ≥ 350mm3 ----225±5°C)

 

 

(Pkg thickness ≤ 2.5mm or

 

 

Pkg volume ≤ 350mm3 ----240±5°C )

 

Temperature cycle test

-65(15mins)~150°C (15mins), 200 cycles

 

Pressure cooker test

TA =121°C, RH=100%, pressure=2 atm,

 

TD (durance)= 96 hrs

 

 

 

 

 

 

High temperature /

TA=85°C , RH=85%TD (durance)=168 , 500 hrs

 

High humidity test

 

 

 

 

 

 

High-temperature

TA=150°C, TD (durance)=500, 1000 hrs

 

storage life

 

 

 

 

 

 

High-temperature

TA=125°C, VCC=Max. operating voltage,

 

operating life

TD (durance) =168, 500, 1000 hrs

 

 

 

 

Latch-up

TA=25°C, VCC=Max. operating voltage, 150mA/20V

 

ESD (HBM)

TA=25°C, ≥∣± 3KV

IP_ND,OP_ND,IO_ND

IP_NS,OP_NS,IO_NS

 

 

 

 

IP_PD,OP_PD,IO_PD,

 

 

ESD (MM)

TA=25, ≥∣± 300V

IP_PS,OP_PS,IO_PS,

VDD-VSS(+),VDD_VSS

 

 

 

 

(-)mode

 

 

 

C.1 Address Trap Detect

An address trap detect is one of the MCU embedded fail-safe functions that detects MCU malfunction caused by noise or the like. Whenever the MCU attempts to fetch an instruction from a certain section of ROM, an internal recovery circuit is auto started. If a noise caused address error is detected, the MCU will repeat execution of the program until the noise is eliminated. The MCU will then continue to execute the next program.

Product Specification (V1.2) 05.18.2007

• 83

(This specification is subject to change without further notice)

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IBM EM78P259N/260N manual Quality Assurance and Reliability, Address Trap Detect, Test Category Test Conditions Remarks