ELECTRICAL DATA S3C8245/P8245/C8249/P8249
19-14
X
IN
, XT
IN
1/fosc1, 1/fosc2
0.1V
t
XL
, t
XTL
t
XH
, t
XTH
V
DD
- 0.1V
Figure 19-7. Clock Timing Measurement at XIN
Table 19-13. Sub Oscillator Frequency (fOSC2)
(TA = -25 °C + 85 °C, VDD = 1.8 V to 5.5 V)
Oscillator Clock Circuit Test Condition Min Typ Max Unit
Crystal
C1 C2
XT
IN
XT
OUT
R
Crystal oscillation frequency
C1 = 22 pF, C2 = 33 pF
R = 39 k
32 32.768 35 kHz
External Clock
XT
IN
XT
OUT
XTIN input frequency 32 100 kHz