Cypress CY7C1382F Pin Definitions Name Description, Power supply inputs to the core of the device

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CY7C1380D, CY7C1382D

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CY7C1380F, CY7C1382F

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Table 1. Pin Definitions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Name

I/O

 

 

 

 

Description

 

 

 

A0, A1, A

Input-

Address inputs used to select one of the address locations. Sampled at the rising edge of

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 [2]are sampled active. A1: A0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

are fed to the two-bit counter..

 

 

 

 

 

A,

 

 

 

B

Input-

Byte write select inputs, active LOW. Qualified with

 

to conduct byte writes to the SRAM.

 

 

BW

BW

BWE

 

BWC, BWD

Synchronous

Sampled on the rising edge of CLK.

 

 

 

 

 

 

 

 

 

 

 

Input-

Global write enable input, active LOW. When asserted LOW on the rising edge of CLK, a

 

 

GW

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

global write is conducted (all bytes are written, regardless of the values on BWX and BWE).

 

 

 

 

 

 

 

 

 

 

 

Input-

Byte write enable input, active LOW. Sampled on the rising edge of CLK. This signal must be

 

 

BWE

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW to conduct a byte write.

 

 

 

 

 

 

 

CLK

Input-

Clock input. Used to capture all synchronous inputs to the device. Also used to increment the

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Clock

burst counter when ADV is asserted LOW, during a burst operation.

 

 

 

 

 

 

 

 

 

 

 

 

1

 

 

 

Input-

Chip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

CE2 and CE3 to select or deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled

 

 

 

 

 

 

 

 

 

 

 

 

 

 

only when a new external address is loaded.

 

 

CE2 [2]

Input-

Chip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

with CE1 and CE3 to select or deselect the device. CE2 is sampled only when a new external

 

 

 

 

 

 

 

 

 

 

 

 

 

 

address is loaded.

 

 

 

 

 

 

 

 

 

3 [2]

Input-

Chip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

CE1 and CE2 to select or deselect the device. CE3 is sampled only when a new external address

 

 

 

 

 

 

 

 

 

 

 

 

 

 

is loaded.

 

 

 

 

 

 

 

 

Input-

Output enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When

 

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act

 

 

 

 

 

 

 

 

 

 

 

 

 

 

as input data pins. OE is masked during the first clock of a read cycle when emerging from a

 

 

 

 

 

 

 

 

 

 

 

 

 

 

deselected state.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Advance input signal, sampled on the rising edge of CLK, active LOW. When asserted, it

 

 

ADV

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

automatically increments the address in a burst cycle.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address strobe from processor, sampled on the rising edge of CLK, active LOW. When

 

 

ADSP

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers. A1: A0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is

 

 

 

 

 

 

 

 

 

 

 

 

 

 

recognized. ASDP is ignored when CE1 is deasserted HIGH.

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address strobe from controller, sampled on the rising edge of CLK, active LOW. When

 

 

ADSC

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers. A1: A0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is

 

 

 

 

 

 

 

 

 

 

 

 

 

 

recognized.

 

 

 

 

 

 

 

ZZ

Input-

ZZ sleep input. This active HIGH input places the device in a non-time critical sleep condition

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ

 

 

 

 

 

 

 

 

 

 

 

 

 

 

pin has an internal pull down.

 

 

 

 

 

 

 

DQs, DQPX

I/O-

Bidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

by the rising edge of CLK. As outputs, they deliver the data contained in the memory location

 

 

 

 

 

 

 

 

 

 

 

 

 

 

specified by the addresses presented during the previous clock rise of the read cycle. The

 

 

 

 

 

 

 

 

 

 

 

 

 

 

direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

When HIGH, DQs and DQPX are placed in a tri-state condition.

 

 

VDD

Power Supply

Power supply inputs to the core of the device.

 

 

 

VSS

Ground

Ground for the core of the device.

 

 

 

VSSQ

I/O Ground

Ground for the I/O circuitry.

 

 

 

VDDQ

I/O Power

Power supply for the I/O circuitry.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Supply

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Document #: 38-05543 Rev. *F

 

 

 

 

 

 

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Contents Selection Guide FeaturesFunctional Description Description 250 MHz 200 MHz 167 MHz UnitLogic Block Diagram CY7C1380D/CY7C1380F 3 512K x Logic Block Diagram CY7C1382D/CY7C1382F 3 1M x Pin Configurations Pin Tqfp Pinout 3-Chip EnableBall BGA Pinout Ball Fbga Pinout 3-Chip Enable Pin Definitions Name Description Power supply inputs to the core of the devicePower supply for the I/O circuitry Ground for the core of the devicePin Definitions TMSTCK Jtag Single Write Accesses Initiated by Adsc Single Write Accesses Initiated by AdspSingle Read Accesses Functional OverviewAddress Sleep ModeBurst Sequences A1 A0 Parameter Description Test Conditions MinTruth Table Operation Add. UsedTruth Table for Read/Write 4 Function CY7C1380D/CY7C1380FFunction CY7C1382D/CY7C1382F TAP Controller State Diagram TAP Controller Block DiagramIeee 1149.1 Serial Boundary Scan Jtag TAP Instruction Set Bypass RegisterParameter Description Min TAP TimingReserved Clock5V TAP AC Test Conditions TAP DC Electrical Characteristics And Operating Conditions3V TAP AC Test Conditions Parameter Description Test Conditions MinIdentification Codes Identification Register DefinitionsScan Register Sizes Register Name Bit SizeBall BGA Boundary Scan Order 14 Bit # Ball IDA10 B10 P10 Operating Range Electrical Characteristics Over the Operating RangeMaximum Ratings Range AmbientPackage CapacitanceThermal Resistance EIA/JESD51AC Test Loads and Waveforms 3V I/O Test Load 5V I/O Test LoadSwitching Characteristics Over the Operating Range 20 Setup TimesOutput Times Switching Waveforms Read Cycle TimingWrite Cycle Timing 26 Read/Write Cycle Timing 26, 28 ZZ Mode Timing 30 Ordering Information 200 167 Package Diagrams Pin Thin Plastic Quad Flat Pack 14 x 20 x 1.4 mmBall BGA 14 x 22 x 2.4 mm Soldernotespad Type NON-SOLDER Mask Defined Nsmd Document History Submission Orig. Description of Change DateSales, Solutions, and Legal Information Worldwide Sales and Design Support Products PSoC SolutionsUSB