Cypress CY7C1526V18, CY7C1513V18 manual Switching Waveforms, Read/Write/Deselect Sequence 28, 29

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CY7C1511V18, CY7C1526V18

CY7C1513V18, CY7C1515V18

Switching Waveforms

Figure 5. Read/Write/Deselect Sequence [28, 29, 30]

NOP

READ

WRITE

READ

WRITE

NOP

7

1

2

3

4

5

6

K

K RPS

WPS

t KH

tKL t CYC t KHKH

t SC tHC

t SC t HC

A

A0

A1

A2

 

tSA

tHA

 

tSD

D

Q

Q00

A3

 

 

 

 

tHD

t HD

 

 

 

tSD

 

 

 

 

D12

 

 

D32

D33

Q02

Q20

Q21

Q22

tCO

tCQDOH

 

 

t CHZ

t KHCH

t KHCH t CLZ

tDOH

 

 

 

 

 

 

 

 

 

tCQD

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

C

t CYC t KHKH

C

t CQOH

CQ

t CCQO

t KH

tKL

CQ

t CQOH t CCQO

DON’T CARE

UNDEFINED

Notes

28.Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0+1.

29.Outputs are disabled (High-Z) one clock cycle after a NOP.

30.In this example, if address A2 = A1, then data Q20 = D10, Q21 = D11, Q22 = D12, and Q23 = D13. Write data is forwarded immediately as read results. This note applies to the whole diagram.

Document Number: 38-05363 Rev. *F

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Contents Functional Description FeaturesConfigurations Selection GuideDoff Logic Block Diagram CY7C1511V18Logic Block Diagram CY7C1526V18 Logic Block Diagram CY7C1513V18 Logic Block Diagram CY7C1515V18CY7C1511V18 8M x Pin ConfigurationBall Fbga 15 x 17 x 1.4 mm Pinout CY7C1526V18 8M xCY7C1515V18 2M x CY7C1513V18 4M xWPS BWS Pin Definitions Pin Name Pin DescriptionReferenced with Respect to Power Supply Inputs to the Core of the DevicePower Supply Inputs for the Outputs of the Device TDO for JtagRead Operations Single Clock ModeFunctional Overview Write OperationsProgrammable Impedance Concurrent TransactionsDepth Expansion Echo ClocksSram #1 Application ExampleTruth Table OperationNWS1 Write Cycle DescriptionsComments BWS0BWS0 BWS1 BWS2 BWS3 Ieee 1149.1 Serial Boundary Scan Jtag Idcode TAP Controller State Diagram TDI TAP Controller Block DiagramTAP Electrical Characteristics TCKTAP AC Switching Characteristics TAP Timing and Test ConditionsInstruction Codes Identification Register DefinitionsScan Register Sizes Register Name Bit SizeBoundary Scan Order Bit # Bump IDDLL Constraints Power Up Sequence in QDR-II SramPower Up Sequence Maximum Ratings Electrical CharacteristicsDC Electrical Characteristics AC Electrical Characteristics Parameter Description Test Conditions Max Unit CapacitanceThermal Resistance Parameter Description Test Conditions Fbga UnitHigh Switching CharacteristicsParameter Min Max LOWParameter Min Max Output Times DLL TimingSwitching Waveforms Read/Write/Deselect Sequence 28, 29Ordering Information 250 167 Package Diagram Ball Fbga 15 x 17 x 1.4 mmREV ECN no Submission ORIG. Description of Change Date Document HistoryDocument Number VKN/AESA Sales, Solutions, and Legal InformationWorldwide Sales and Design Support Products PSoC Solutions Pyrs