Cypress CY7C1511V18, CY7C1513V18 TAP AC Switching Characteristics, TAP Timing and Test Conditions

Page 17

CY7C1511V18, CY7C1526V18

CY7C1513V18, CY7C1515V18

TAP AC Switching Characteristics

Over the Operating Range [15, 16]

Parameter

Description

Min

Max

Unit

tTCYC

TCK Clock Cycle Time

50

 

ns

tTF

TCK Clock Frequency

 

20

MHz

tTH

TCK Clock HIGH

20

 

ns

tTL

TCK Clock LOW

20

 

ns

Setup Times

 

 

 

 

 

 

 

 

 

tTMSS

TMS Setup to TCK Clock Rise

5

 

ns

tTDIS

TDI Setup to TCK Clock Rise

5

 

ns

tCS

Capture Setup to TCK Rise

5

 

ns

Hold Times

 

 

 

 

tTMSH

TMS Hold after TCK Clock Rise

5

 

ns

tTDIH

TDI Hold after Clock Rise

5

 

ns

tCH

Capture Hold after Clock Rise

5

 

ns

Output Times

 

 

 

 

 

 

 

 

 

tTDOV

TCK Clock LOW to TDO Valid

 

10

ns

tTDOX

TCK Clock LOW to TDO Invalid

0

 

ns

TAP Timing and Test Conditions

Figure 2 shows the TAP timing and test conditions. [16]

Figure 2. TAP Timing and Test Conditions

 

 

 

0.9V

 

 

 

 

 

 

50Ω

 

 

 

 

 

 

 

 

 

 

 

 

TDO

 

 

 

 

 

 

Z0

= 50Ω

 

 

 

CL = 20 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ALL INPUT PULSES

1.8V

0.9V

0V

(a)GND

Test Clock

TCK

Test Mode Select

TMS

Test Data In

TDI

Test Data Out

TDO

tTH

tTMSS

tTDIS

tTL

tTCYC

tTMSH

tTDIH

tTDOV

 

 

 

t

 

 

 

 

 

 

 

 

TDOX

Notes

15.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.

16.Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.

Document Number: 38-05363 Rev. *F

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Contents Configurations FeaturesFunctional Description Selection GuideDoff Logic Block Diagram CY7C1511V18Logic Block Diagram CY7C1526V18 Logic Block Diagram CY7C1515V18 Logic Block Diagram CY7C1513V18Ball Fbga 15 x 17 x 1.4 mm Pinout Pin ConfigurationCY7C1511V18 8M x CY7C1526V18 8M xCY7C1515V18 2M x CY7C1513V18 4M xWPS BWS Pin Name Pin Description Pin DefinitionsPower Supply Inputs for the Outputs of the Device Power Supply Inputs to the Core of the DeviceReferenced with Respect to TDO for JtagFunctional Overview Single Clock ModeRead Operations Write OperationsDepth Expansion Concurrent TransactionsProgrammable Impedance Echo ClocksTruth Table Application ExampleSram #1 OperationComments Write Cycle DescriptionsNWS1 BWS0BWS0 BWS1 BWS2 BWS3 Ieee 1149.1 Serial Boundary Scan Jtag Idcode TAP Controller State Diagram TAP Electrical Characteristics TAP Controller Block DiagramTDI TCKTAP Timing and Test Conditions TAP AC Switching CharacteristicsScan Register Sizes Identification Register DefinitionsInstruction Codes Register Name Bit SizeBit # Bump ID Boundary Scan OrderDLL Constraints Power Up Sequence in QDR-II SramPower Up Sequence Maximum Ratings Electrical CharacteristicsDC Electrical Characteristics AC Electrical Characteristics Thermal Resistance CapacitanceParameter Description Test Conditions Max Unit Parameter Description Test Conditions Fbga UnitParameter Min Max Switching CharacteristicsHigh LOWDLL Timing Parameter Min Max Output TimesRead/Write/Deselect Sequence 28, 29 Switching WaveformsOrdering Information 250 167 Ball Fbga 15 x 17 x 1.4 mm Package DiagramREV ECN no Submission ORIG. Description of Change Date Document HistoryDocument Number Worldwide Sales and Design Support Products PSoC Solutions Sales, Solutions, and Legal InformationVKN/AESA Pyrs