CY7C1470BV33 CY7C1472BV33, CY7C1474BV33
Instruction Register
When the TAP controller is in the
Bypass Register
To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a
Boundary Scan Register
The boundary scan register is connected to all the input and bidirectional balls on the SRAM.
The boundary scan register is loaded with the contents of the RAM IO ring when the TAP controller is in the
The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI and the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a
TAP Instruction Set
Overview
Eight different instructions are possible with the
The TAP controller used in this SRAM is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented.
The TAP controller cannot be used to load address data or control signals into the SRAM and cannot preload the IO buffers. The SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE/PRELOAD; rather, it performs a capture of the IO ring when these instruc- tions are executed.
Instructions are loaded into the TAP controller during the
EXTEST
EXTEST is a mandatory 1149.1 instruction which is executed whenever the instruction register is loaded with all 0s. EXTEST is not implemented in this SRAM TAP controller, and therefore this device is not compliant to 1149.1. The TAP controller does recognize an
When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE/PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE/PRELOAD instruction, EXTEST places the SRAM outputs in a
IDCODE
The IDCODE instruction loads a
The IDCODE instruction is loaded into the instruction register during power up or whenever the TAP controller is in a test logic reset state.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register between the TDI and TDO balls when the TAP controller is in a
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The PRELOAD portion of this instruction is not implemented, so the device TAP controller is not fully 1149.1 compliant.
When the SAMPLE/PRELOAD instruction is loaded into the instruction register and the TAP controller is in the
The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the
To guarantee that the boundary scan register captures the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture setup plus hold time (tCS plus tCH).
The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still
Document #: | Page 13 of 30 |
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