CY7C1470BV33 CY7C1472BV33, CY7C1474BV33
access (read, write, or deselect) is latched into the Address Register (provided the appropriate control signals are asserted).
On the next clock rise the data presented to DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV33, DQa,b/DQPa,b for CY7C1472BV33, and DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV33) (or a subset for byte write operations, see “Partial Write Cycle Description” on page 11 for details) inputs is latched into the device and the write is complete.
The data written during the Write operation is controlled by BW (BWa,b,c,d for CY7C1470BV33, BWa,b for CY7C1472BV33, and BWa,b,c,d,e,f,g,h for CY7C1474BV33) signals. The CY7C1470BV33, CY7C1472BV33, and CY7C1474BV33 provides Byte Write capability that is described in “Partial Write Cycle Description” on page 11. Asserting the Write Enable input (WE) with the selected BW input selectively writes to only the desired bytes. Bytes not selected during a Byte Write operation remain unaltered. A synchronous
Because the CY7C1470BV33, CY7C1472BV33, and CY7C1474BV33 are common IO devices, data must not be driven into the device while the outputs are active. The OE can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV33, DQa,b/DQPa,b for CY7C1472BV33, and DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV33) inputs. Doing so
Burst Write Accesses
The CY7C1470BV33, CY7C1472BV33, and CY7C1474BV33 has an
clock rise, the Chip Enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BW (BWa,b,c,d for CY7C1470BV33, BWa,b for CY7C1472V33, and BWa,b,c,d,e,f,g,h for CY7C1474BV33) inputs must be driven in each cycle of the burst write to write the correct bytes of data.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected before entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW.
Table 2. Interleaved Burst Address Table (MODE = Floating or VDD)
First | Second | Third | Fourth |
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Address | Address | Address | Address |
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A1,A0 | A1,A0 | A1,A0 | A1,A0 |
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00 | 01 | 10 | 11 |
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01 | 00 | 11 | 10 |
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10 | 11 | 00 | 01 |
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11 | 10 | 01 | 00 |
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Table 3. Linear Burst Address Table (MODE = GND) |
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First | Second | Third | Fourth |
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Address | Address | Address | Address |
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A1,A0 | A1,A0 | A1,A0 | A1,A0 |
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00 | 01 | 10 | 11 |
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01 | 10 | 11 | 00 |
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10 | 11 | 00 | 01 |
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11 | 00 | 01 | 10 |
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ZZ Mode Electrical Characteristics
Parameter | Description | Test Conditions | Min | Max | Unit |
IDDZZ | Sleep mode standby current | ZZ > VDD − 0.2V |
| 120 | mA |
tZZS | Device operation to ZZ | ZZ > VDD − 0.2V |
| 2tCYC | ns |
tZZREC | ZZ recovery time | ZZ < 0.2V | 2tCYC |
| ns |
tZZI | ZZ active to sleep current | This parameter is sampled |
| 2tCYC | ns |
tRZZI | ZZ Inactive to exit sleep current | This parameter is sampled | 0 |
| ns |
Document #: | Page 9 of 30 |
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