CY7C1470V33
CY7C1472V33
CY7C1474V33
IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1470V33, CY7C1472V33, and CY7C1474V33 incorporates a serial boundary scan test access port (TAP). This port operates in accordance with IEEE Standard
The CY7C1470V33, CY7C1472V33, and CY7C1474V33 contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are inter- nally pulled up and may be unconnected. They may alternately be connected to VDD through a
Test MODE SELECT (TMS)
The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level.
Test Data-In (TDI)
The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. (See Tap Controller Block Diagram.)
Test Data-Out (TDO)
The TDO output ball is used to serially clock
TAP Controller Block Diagram
TAP Controller State Diagram
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RESET |
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0 | 1 | SELECT | 1 | SELECT | 1 | |
IDLE |
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| 0 |
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| 0 | 0 | ||
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| 1 |
| 1 |
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| 1 |
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TDI
Selection Circuitry
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| 0 |
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| Bypass Register |
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| 2 | 1 | 0 |
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| Instruction Register |
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| 31 | 30 | 29 | . | . | . | 2 | 1 | 0 |
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Identification Register |
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| x | . | . | . | . | . | 2 | 1 | 0 |
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Boundary Scan Register
Selection Circuitry
TDO
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0 | 0 | ||||
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1 | 0 |
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The 0/1 next to each state represents the value of TMS at the rising edge of TCK.
Test Access Port (TAP)
Test Clock (TCK)
The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK.
TCK
TMS |
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Performing a TAP Reset
A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating.
At
TAP Registers
Registers are connected between the TDI and TDO balls and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK.
Document #: | Page 11 of 29 |
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