Cypress CY7C1472V33, CY7C1470V33, CY7C1474V33 manual Pin Definitions, Pin Name Type Pin Description

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CY7C1470V33

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CY7C1472V33

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CY7C1474V33

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin Definitions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin Name

I/O Type

 

Pin Description

 

 

 

 

 

 

 

 

A0

Input-

 

Address Inputs used to select one of the address locations. Sampled at the rising edge of

 

 

A1

Synchronous

 

the CLK.

 

 

A

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

a

Input-

 

Byte Write Select Inputs, active LOW. Qualified with

 

to conduct writes to the SRAM.

 

 

BW

WE

 

 

BWb

Synchronous

 

Sampled on the rising edge of CLK. BWa controls DQa and DQPa, BWb controls DQb and DQPb,

 

 

BWc

 

 

 

BWc controls DQc and DQPc, BWd controls DQd and DQPd, BWe controls DQe and DQPe, BWf

 

 

BWd

 

 

 

controls DQf and DQPf, BWg controls DQg and DQPg, BWh controls DQh and DQPh.

 

 

BWe

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

BWf

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

BWg

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

BWh

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

 

Write Enable Input, active LOW. Sampled on the rising edge of CLK if

 

is active LOW. This

 

 

WE

CEN

 

 

 

 

 

 

 

 

 

 

Synchronous

 

signal must be asserted LOW to initiate a write sequence.

 

 

 

 

 

 

 

 

 

 

Input-

 

Advance/Load Input used to advance the on-chip address counter or load a new address.

 

 

ADV/LD

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

 

When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a

 

 

 

 

 

 

 

 

 

 

 

 

 

new address can be loaded into the device for an access. After being deselected, ADV/LD should

 

 

 

 

 

 

 

 

 

 

 

 

 

be driven LOW in order to load a new address.

 

 

CLK

Input-

 

Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with

 

 

 

 

CEN.

 

 

 

 

 

 

 

 

 

 

Clock

 

CLK is only recognized if CEN is active LOW.

 

 

 

1

 

Input-

 

Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

Synchronous

 

CE2 and CE3 to select/deselect the device.

 

 

CE2

Input-

 

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with

 

 

 

 

 

 

 

 

 

 

Synchronous

 

CE1 and CE3 to select/deselect the device.

 

 

 

3

 

Input-

 

Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

Synchronous

 

CE1 and CE2 to select/deselect the device.

 

 

 

 

 

 

Input-

 

Output Enable, active LOW. Combined with the synchronous logic block inside the device to

 

 

OE

 

 

 

 

 

 

 

 

 

 

Asynchronous

 

control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs.

 

 

 

 

 

 

 

 

 

 

 

 

 

When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE is masked during

 

 

 

 

 

 

 

 

 

 

 

 

 

the data portion of a write sequence, during the first clock when emerging from a deselected state

 

 

 

 

 

 

 

 

 

 

 

 

 

and when the device has been deselected.

 

 

 

 

 

 

 

 

Input-

 

Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the

 

 

CEN

 

 

 

 

 

 

 

 

 

 

Synchronous

 

SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not

 

 

 

 

 

 

 

 

 

 

 

 

 

deselect the device, CEN can be used to extend the previous cycle when required.

 

 

DQS

I/O-

 

Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered

 

 

 

 

 

 

 

 

 

 

Synchronous

 

by the rising edge of CLK. As outputs, they deliver the data contained in the memory location

 

 

 

 

 

 

 

 

 

 

 

 

 

specified by A[17:0] during the previous clock rise of the read cycle. The direction of the pins is

 

 

 

 

 

 

 

 

 

 

 

 

 

controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave

 

 

 

 

 

 

 

 

 

 

 

 

 

as outputs. When HIGH, DQa–DQdare placed in a tri-state condition. The outputs are automat-

 

 

 

 

 

 

 

 

 

 

 

 

 

ically tri-stated during the data portion of a write sequence, during the first clock when emerging

 

 

 

 

 

 

 

 

 

 

 

 

 

from a deselected state, and when the device is deselected, regardless of the state of OE.

 

 

DQPX

I/O-

 

Bidirectional Data Parity I/O lines. Functionally, these signals

are

identical to DQX. During write

 

 

 

 

 

 

 

 

 

 

Synchronous

 

sequences, DQPa is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by BWc,

 

 

 

 

 

 

 

 

 

 

 

 

 

and DQPd is controlled by BWd, DQPe is controlled by BWe, DQPf is controlled by BWf, DQPg

 

 

 

 

 

 

 

 

 

 

 

 

 

is controlled by BWg, DQPh is controlled by BWh.

 

 

MODE

Input Strap Pin

 

Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order.

 

 

 

 

 

 

 

 

 

 

 

 

 

Pulled LOW selects the linear burst order. MODE should not change states during operation.

 

 

 

 

 

 

 

 

 

 

 

 

 

When left floating MODE will default HIGH, to an interleaved burst order.

 

 

TDO

JTAG Serial

 

Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK.

 

 

 

 

 

 

 

 

 

 

Output

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

 

 

 

 

 

 

 

 

 

 

 

 

 

TDI

JTAG Serial Input

Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK.

 

 

 

 

 

 

 

 

 

 

Synchronous

 

 

 

 

 

 

 

 

 

 

 

Document #: 38-05289 Rev. *I

 

 

 

 

 

 

 

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Contents Functional Description FeaturesLogic Block Diagram-CY7C1470V33 2M x Cypress Semiconductor Corporation250 MHz 200 MHz 167 MHz Unit Logic Block Diagram-CY7C1472V33 4M xMaximum Access Time Maximum Operating Current Maximum Cmos Standby CurrentPin Configurations Pin Tqfp Packages 4M xCY7C1472V33 4M x BWS Pin Definitions Pin Name Type Pin DescriptionByte Write Select Inputs, active LOW. Qualified with Functional Overview Interleaved Burst Address Table Mode = Floating or VDD Linear Burst Address Table Mode = GNDZZ Mode Electrical Characteristics Operation Address Used Function CY7C1472V33 Partial Write Cycle Description1, 2, 3Function CY7C1470V33 BW d BW c BW b BW a Function CY7C1474V33TAP Controller Block Diagram TAP Controller State Diagram Ieee 1149.1 Serial Boundary Scan JtagInstruction Register TAP Instruction SetParameter Description Min Max Unit Clock TAP AC Switching Characteristics Over the Operating Range9TAP Timing Output Times3V TAP AC Test Conditions 5V TAP AC Test ConditionsIdentification Register Definitions Scan Register SizesIdentification Codes Boundary Scan Exit Order 2M x Boundary Scan Exit Order 4M xBit # Ball ID J10 Boundary Scan Exit Order 1M xA11 W10Operating Range Electrical Characteristics Over the Operating Range13Maximum Ratings Ambient RangeCapacitance15 Thermal ResistanceAC Test Loads and Waveforms Switching Characteristics Over the Operating Range 16 250 200 167 Parameter Description Unit Min MaxSet-up Times CEN Switching WaveformsRead/Write/Timing22, 23 Address A1 A2ZZ Mode Timing26 NOP, Stall and Deselect Cycles22, 23Ordering Information 250 Package Diagrams Pin Thin Plastic Quad Flatpack 14 x 20 x 1.4 mmBall Fbga 15 x 17 x 1.4 mm Ball Fbga 14 x 22 x 1.76 mm ECN No Issue Date Orig. Description of Change Document HistoryRXU VKN