Chapter 7. Test Menu

PATTERN RESULT

Displays the results of the test currently active. Leaving and returning to this menu item does not interrupt the test.

Pressing 2 injects errors into the test pattern. These errors are detected by the device performing the pattern check.

ES

The number of seconds with at least 1 bit error.

BES

The number of seconds with more than 1 bit error and

 

less than 320.

SES

The number of seconds with more than 320 bit errors.

*SYNC

Indicates if pattern sync is (yes) or is not (no) valid. The

 

asterisk (*) indicates if pattern sync has been lost since

 

the start of testing.

Clear results by pressing shift 9. The results are accumulated until the test pattern is set to None or Cleared.

Using TST TS0s for testing can be very useful, particularly in Frac- tional E1 applications. You can run an end-to-end test on the Frac- tional TS0s by 1) setting for Map B the TST in the same TS0 as used by Map A to receive data from an Nx56/64 port and 2) by looping the far end using a V.54 loopback code on the Nx56/64 port. In addition, a single TS0 can be used for continuous testing while other TS0s are passing normal data. This will also provide an end to end check on the entire link. Set each end to send QRSS in TST TS0s (using 1 TS0) and occasionally view the results on the Pattern Result menu selection.

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ADTRAN ESU 120e user manual Bes, Ses, Sync