ADSP-2186

ABSOLUTE MAXIMUM RATINGS*

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V

Input Voltage . . . . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V

Output Voltage Swing . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V

Operating Temperature Range (Ambient) . . –40°C to +85°C

Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C

Lead Temperature (5 sec) TQFP . . . . . . . . . . . . . . . +280°C

*Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. These are stress ratings only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

ESD SENSITIVITY

The ADSP-2186 is an ESD (electrostatic discharge) sensitive device. Electrostatic charges readily accumulate on the human body and equipment and can discharge without detection. Permanent damage may occur to devices subjected to high energy electrostatic discharges.

The ADSP-2186 features proprietary ESD protection circuitry to dissipate high energy discharges (Human Body Model) per method 3015 of MIL-STD-883. Proper ESD precautions are recom- mended to avoid performance degradation or loss of functionality. Unused devices must be stored in conductive foam or shunts, and the foam should be discharged to the destination before devices are removed.

WARNING!

ESD SENSITIVE DEVICE

ADSP-2186 TIMING PARAMETERS

GENERAL NOTES

Use the exact timing information given. Do not attempt to derive parameters from the addition or subtraction of others. While addition or subtraction would yield meaningful results for an individual device, the values given in this data sheet reflect statistical variations and worst cases. Consequently, you cannot meaningfully add up parameters to derive longer times.

TIMING NOTES

Switching characteristics specify how the processor changes its signals. You have no control over this timing—circuitry external to the processor must be designed for compatibility with these signal characteristics. Switching characteristics tell you what the processor will do in a given circumstance. You can also use switching characteristics to ensure that any timing requirement of a device connected to the processor (such as memory) is satisfied.

Timing requirements apply to signals that are controlled by circuitry external to the processor, such as the data input for a read operation. Timing requirements guarantee that the proces- sor operates correctly with other devices.

MEMORY TIMING SPECIFICATIONS

The table below shows common memory device specifications and the corresponding ADSP-2186 timing parameters, for your convenience.

Memory

ADSP-2186

Timing

Device

Timing

Parameter

Specification

Parameter

Definition

 

 

 

Address Setup to

tASW

A0–A13, xMS Setup

Write Start

 

before WR Low

Address Setup to

tAW

A0–A13, xMS Setup

Write End

 

before WR Deasserted

Address Hold Time

tWRA

A0–A13, xMS Hold before

 

 

WR Low

Data Setup Time

tDW

Data Setup before WR

 

 

High

Data Hold Time

tDH

Data Hold after WR High

OE to Data Valid

tRDD

RD Low to Data Valid

Address Access Time

tAA

A0–A13, xMS to Data

 

 

Valid

 

 

 

xMS = PMS, DMS, BMS, CMS, IOMS.

FREQUENCY DEPENDENCY FOR TIMING

SPECIFICATIONS

tCK is defined as 0.5 tCKI. The ADSP-2186 uses an input clock with a frequency equal to half the instruction rate: a 16.67 MHz

input clock (which is equivalent to 60 ns) yields a 30 ns proces- sor cycle (equivalent to 33 MHz). tCK values within the range of

0.5tCKI period should be substituted for all relevant timing para- meters to obtain the specification value.

Example: tCKH = 0.5 tCK – 7 ns = 0.5 (30 ns) – 7 ns = 8 ns

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Analog Devices ADSP-2186 specifications WR Low