CY7C1381DV25, CY7C1381FV25 CY7C1383DV25, CY7C1383FV25
2.5V TAP AC Test Conditions
Input pulse levels | VSS to 2.5V |
Input rise and fall time | 1 ns |
Input timing reference levels | 1.25V |
Output reference levels | 1.25V |
Test load termination supply voltage | 1.25V |
2.5V TAP AC Output Load Equivalent
1.25V
50Ω
TDO
ZO= 50 Ω |
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TAP DC Electrical Characteristics And Operating Conditions (0°C < TA < +70°C; VDD = 2.5V ±0.125V unless otherwise noted) [12]
Parameter | Description |
| Test Conditions | Min. | Max. | Unit | |
VOH1 | Output HIGH Voltage | IOH = | 2.0 |
| V | ||
VOH2 | Output HIGH Voltage | IOH = | 2.1 |
| V | ||
VOL1 | Output LOW Voltage | IOL = 8.0 mA, VDDQ = 2.5V |
| 0.4 | V | ||
VOL2 | Output LOW Voltage | IOL = 100 µA |
| VDDQ = 2.5V |
| 0.2 | V |
VIH | Input HIGH Voltage |
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| VDDQ = 2.5V | 1.7 | VDD + 0.3 | V |
VIL | Input LOW Voltage |
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| VDDQ = 2.5V | 0.7 | V | |
IX | Input Load Current | GND < VIN < VDDQ |
| 5 | µA |
Identification Register Definitions
Instruction Field | CY7C1381DV25/ | CY7C1383DV25/ | Description |
CY7C1381FV25 | CY7C1383FV25 | ||
| (512K x 36) | (1 Mbit x 18) |
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Revision Number (31:29) | 000 | 000 | Describes the version number |
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Device Depth (28:24) | 01011 | 01011 | Reserved for internal use. |
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Device Width (23:18) | 101001 | 101001 | Defines the memory type and architecture |
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Device Width (23:18) | 000001 | 000001 | Defines the memory type and architecture |
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Cypress Device ID (17:12) | 100101 | 010101 | Defines the width and density |
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Cypress JEDEC ID Code (11:1) | 00000110100 | 00000110100 | Allows unique identification of SRAM vendor |
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ID Register Presence Indicator (0) | 1 | 1 | Indicates the presence of an ID register |
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Scan Register Sizes
Register Name | Bit Size (x36) | Bit Size (x18) |
Instruction Bypass | 3 | 3 |
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Bypass | 1 | 1 |
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ID | 32 | 32 |
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Boundary Scan Order | 85 | 85 |
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Boundary Scan Order | 89 | 89 |
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Note
12. All voltages referenced to VSS (GND).
Document #: | Page 14 of 28 |
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