Glossary
Boundary scan chain
| A boundary scan chain is made up of | |
| boundary scan technology using a standard JTAG TAP interface. Each device contains | |
| at least one TAP controller containing shift registers that form the chain connected | |
| between TDI and TDO, through which test data is shifted. Processors can contain | |
| several shift registers to enable you to access selected parts of the device. | |
Burst | A group of transfers to consecutive addresses. Because the addresses are consecutive, | |
| there is no requirement to supply an address for any of the transfers after the first one. | |
| This increases the speed at which the group of transfers can occur. Bursts over AMBA | |
| are controlled using signals to indicate the length of the burst and how the addresses are | |
| incremented. | |
| See also Beat. | |
Byte | An | |
Byte lane strobe | A signal that is used for unaligned or | |
| lanes that are active in a transfer. One bit of this signal corresponds to eight bits of the | |
| data bus. | |
Typically a shared, not | ||
| connects to a single AMBA AHB link. In this case, the bus is implemented with a set of | |
| full AMBA AHB master interfaces. Masters that use the AMBA | |
| must connect through a wrapper to supply full AMBA AHB master signals to support | |
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Endianness | Byte ordering. The scheme that determines the order that successive bytes of a data | |
| word are stored in memory. An aspect of the system’s memory mapping. | |
| See also | |
Byte ordering scheme in which bytes of increasing significance in a data word are stored | ||
| at increasing addresses in memory. | |
| See also | |
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| |
| Memory in which: | |
| • | a byte or halfword at a |
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| halfword within the word at that address |
| • | a byte at a |
|
| halfword at that address. |
See also Big-endian memory.
ARM DDI 0389B | Copyright © 2006 ARM Limited. All rights reserved. |