TROUBLESHOOTING

SIGNAL PATHS

YIG Oscillator

2-20GHz

40MHz-

2GHz

16.8GHz Lowpass

Filter

9.5-

16.25GHz

J4

Switched Filter

40MHz-

19GHz

 

 

 

 

J5

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

6.3-

 

 

 

 

 

15 dB

 

 

 

8.3GHz

 

Pad

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Down

 

 

 

 

Converter

 

 

 

 

 

 

 

 

J3

SPDT Switch

J2

Test B

Test A

X4

(SQM) Forward

X4

(SQM) Reverse

Test B 38-65 GHz

Test A 38-65 GHz

 

 

 

 

 

Test B 38 -65

 

 

 

37 GHz

 

GHz

J1

 

 

 

 

 

 

 

HiPass Filter

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MUX Coupler

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(Forward) J3

 

 

37 GHz

 

 

 

 

 

 

 

 

 

 

 

HiPass Filter

 

 

 

 

 

 

 

 

 

 

 

 

J2

 

 

Test A

 

 

 

 

 

 

 

38-65

 

 

 

 

 

 

 

 

GHz

 

 

 

 

J1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

40MHz - 65GHz (Test B)

Step

Attenuator

**

 

 

 

 

Coupled

 

 

 

 

 

 

Arm

 

J2

 

Front

 

 

 

 

 

 

 

 

 

Panel

 

 

Bias Tee

 

 

 

Port 1

 

Access

 

 

**

J3

 

 

 

 

Coupler

 

Loop**

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Rear

Panel Access Loop **

X2

40MHz-38GHz

(SDM)

 

J3

Transfer Switch

(Test A/ Test B

control)

J2

 

MUX Coupler

 

(reverse)

Test B 40MHz - 38GHz

J2

 

J4

Test A 40MHz - 38GHz

 

 

DCV

Bias Tee

**

40MHz - 65GHz (Test A)

J3

Port 2

Coupler

Coupled

J2

 

Arm

 

Step

Attenuator

**

Device Under Test (DUT)

First LO

(A1 PCB)

Digital Data to

Processor

 

 

 

 

 

 

 

 

DC voltages

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

DC voltages

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

J4

J5

J2

J3

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

J2

J3

Analog to Digital Converter

 

 

 

A3 PCB

 

 

Test A IF

 

 

 

A5 PCB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

J4

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

J2J3

A6 PCB

Test B IF

J4

 

 

 

Power Amp

Sampler/Buffer Amp

 

 

 

 

J1

Second LO

 

 

(A2 PCB)

J2

J7

 

 

 

Test B

Test A

 

 

2.5 MHz CW

2.5 MHz CW

NOTE: Sampler/Buffer amplifiers are individually matched to Power Amplifiers. If either fails, both should be replaced with another matched set, part number ND53249.

** Indicates not present on model 37297B or 37277B

Figure 5-3.37397A Test Signal Path Diagram

373XXA MM

5-25

Page 79
Image 79
Anritsu 373XXA manual Troubleshooting Signal Paths, Sdm

373XXA specifications

The Anritsu 373XXA series is a notable line of microwave and RF signal analyzers designed for comprehensive analysis and testing of various wireless communication technologies. These analyzers are specifically crafted to meet the demands of modern communication systems, making them ideal for engineers and technicians working in wireless research, development, and manufacturing.

One of the main features of the Anritsu 373XXA series is its wide frequency range, which typically spans from as low as 5 kHz to several GHz, accommodating a vast array of signal types and applications. This extensive frequency coverage allows users to test and validate all manner of systems, from LTE and 5G networks to satellite communications, yielding accurate and reliable measurement results.

The device employs advanced measurement technologies that provide in-depth analysis capabilities. Among these technologies is the ability to perform both time and frequency domain measurements, allowing users to visualize and diagnose signal integrity issues effectively. In addition, the 373XXA series incorporates vector signal analysis, which is crucial in evaluating complex modulated signals, commonly found in today’s sophisticated wireless communication protocols.

Another distinguishing characteristic of the Anritsu 373XXA is its user-friendly interface. It features a large, high-resolution display that enables easy navigation through the analyzer's functions and measurements. The intuitive design is further enhanced by customizable settings and measurement configurations that streamline the workflow, making it accessible for both novice and experienced users.

The 373XXA series also supports various digital and analog signal demodulation techniques, ensuring compatibility with an array of communication standards. Furthermore, users can benefit from its built-in signal generation capabilities, which allows for end-to-end testing of devices and systems under realistic operational conditions.

Portability is another key feature of the Anritsu 373XXA series. The compact design and lightweight structure facilitate easy transport, which is particularly advantageous for field applications where mobility is critical.

Overall, the Anritsu 373XXA series stands out as a versatile and powerful tool for professionals in the RF and microwave field, thanks to its extensive frequency range, advanced measurement technologies, user-friendly interface, and portability. Whether developing new wireless standards or troubleshooting existing systems, the 373XXA delivers precision and reliability essential for today’s dynamic communication landscape.