HP 16500B manual Self-Tests Description, ROM Test

Self-Tests Description

The self-tests identify the correct operation of the major sub-systems in the

HP 16500B Logic Analysis System mainframe. The self-tests are not intended for component-level diagnostics.

Two types of tests are performed on the HP 16500B mainframe: the power-up self-tests and the functional performance verification tests.

The power-up self-tests are performed when power is applied to the instrument. When the power-up self- tests are completed and the mainframe sub-systems are determined to be operational, the system configuration menu is displayed.

The functional performance verification tests are run using a separate operating system, the performance verification (PV) operating system. The PV operating system resides on the hard disk drive and can be accessed through the System Test menu.

A third type of test, parametric performance verification (parametric PV), is not performed on the HP 16500B mainframe. However, parametric PV is performed on the modules installed in the mainframe. Consult the individual Service Guides for each of the modules for more information about parametric performance verification.

Power-Up Self-Tests

The HP 16500B power-up tests check the mainframe circuitry only. None of the option modules are tested at power-up. The tests run every time power is applied to the instrument and the results of the tests are reported on the screen.

If a disk is not installed in the disk drive, the advisory "no disk" is added to the Flexible Disk Tests.

If any of the self-tests fail, then the power-up routine is halted and the FATAL ERRORS ENCOUNTERED, BOOT HALTED message appears. A failure indicates that one of the mainframe sub-systems is seriously impaired to the point that reliable operation is not possible, or that a sub-systems is non-operational. The mainframe hardware would require servicing before the mainframe can be used.

If any power-up self-test fails, refer to chapter 5, "Troubleshooting."

The power-up tests perform the following circuit checks: ROM Test, RAM Test, Interrupt Test, Display Test, HIL Controller Test, Front-panel Test, Touchscreen Test, Correlator Test, Hard Disk Test, and Flexible Disk Test.

ROM Test

The ROM Test performs a checksum of both ROMs and compares the checksum value to a stored value. The test responses are "passed," "impaired," or "failed." If the message "impaired" is displayed, only one of the ROMs on the microprocessor board is defective. If the message "failed" is displayed, both ROMs are defective. For ROM Test failures, you can suspect a faulty microprocessor board.

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