Cypress CY7C2563KV18 Power Up Sequence in QDR-II+ Sram, PLL Constraints, VDD / Vddq, Doff DDQ

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PRELIMINARY

CY7C2561KV18, CY7C2576KV18

 

 

CY7C2563KV18, CY7C2565KV18

 

 

 

 

 

 

 

 

Power Up Sequence in QDR-II+ SRAM

QDR-II+ SRAMs must be powered up and initialized in a predefined manner to prevent undefined operations.

Power Up Sequence

Apply power and drive DOFF either HIGH or LOW (All other inputs can be HIGH or LOW).

Apply VDD before VDDQ.

Apply VDDQ before VREF or at the same time as VREF.

Drive DOFF HIGH.

PLL Constraints

PLL uses K clock as its synchronizing input. The input must have low phase jitter, which is specified as tKC Var.

The PLL functions at frequencies down to 120 MHz.

If the input clock is unstable and the PLL is enabled, then the PLL may lock onto an incorrect frequency, causing unstable SRAM behavior. To avoid this, provide 20 μs of stable clock to relock to the desired clock frequency.

Provide stable DOFF (HIGH), power and clock (K, K) for 20 μs to lock the PLL

Figure 5. Power Up Waveforms

~ ~

K

K

 

~ ~

 

Unstable Clock

> 20Πs Stable clock

Start Normal

 

 

Operation

Clock Start (Clock Starts after VDD/ V DDQ Stable)

VDD/ VDDQ

 

 

 

 

 

VDD/ V DDQ Stable (< +/- 0.1V DC per 50ns )

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Fix HIGH (or tie to V )

DOFF

 

 

 

 

 

 

DDQ

 

 

 

 

 

 

 

Document Number: 001-15887 Rev. *E

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Contents Cypress Semiconductor Corporation 198 Champion Court Features ConfigurationsFunctional Description Doff Logic Block Diagram CY7C2561KV18Logic Block Diagram CY7C2576KV18 Logic Block Diagram CY7C2563KV18 Logic Block Diagram CY7C2565KV18CY7C2576KV18 8M x Pin ConfigurationCY7C2561KV18 8M x CY7C2565KV18 2M x CY7C2563KV18 4M xWPS BWS Pin Definitions Pin Name Pin Description Power Supply Inputs to the Core of the Device Power Supply Inputs for the Outputs of the DeviceTDO for Jtag TCK Pin for JtagFunctional Overview Read OperationsWrite Operations Byte Write OperationsValid Data Indicator Qvld Depth ExpansionProgrammable Impedance Echo ClocksOperation Application ExampleTruth Table Write Cycle Descriptions CommentsRemains unaltered During the data portion of a write sequenceWrite cycle description table for CY7C2565KV18 follows DeviceInto the device. D359 remains unaltered Device. D80 and D3518 remains unalteredIeee 1149.1 Serial Boundary Scan Jtag Idcode TAP Controller State Diagram State diagram for the TAP controller followsTAP Electrical Characteristics TAP ControllerParameter Description Test Conditions Min Max Unit GND ≤ VI ≤ VDDTAP AC Switching Characteristics TAP Timing and Test ConditionsScan Register Sizes Register Name Bit Size Instruction Codes DescriptionBoundary Scan Order Bit # Bump ID Power Up Sequence in QDR-II+ Sram Power Up SequencePLL Constraints VDD / VddqElectrical Characteristics DC Electrical CharacteristicsMaximum Ratings Operating RangeAC Electrical Characteristics CapacitanceThermal Resistance Parameter Description Test Conditions Max UnitAC Test Loads and Waveforms Including JIG ScopeSwitching Characteristics Parameter Min MaxHigh LOWSwitching Waveforms Read/Write/Deselect Sequence 32, 33Ordering Information 450 Package Diagram Ball Fbga 13 x 15 x 1.4 mmDocument History Sales, Solutions, and Legal InformationWorldwide Sales and Design Support Products PSoC Solutions