Fujitsu MPG3XXXAH-E manual Features Register values subcommands and functions 1/2

Table 5.8 Features Register values (subcommands) and functions (1/2)

Features Resister	Function
X’D0’	SMART Read Attribute Values:
	A device that received this subcommand asserts the BSY bit and saves all the
	updated attribute values. The device then clears the BSY bit and transfers 512-byte
	attribute value information to the host.
	* For information about the format of the attribute value information, see Table 5.9.
X’D1’	SMART Read Attribute Thresholds:
	This subcommand is used to transfer 512-byte insurance failure threshold value data
	to the host.
	* For information about the format of the insurance failure threshold value data, see
	Table 5.10.
X’D2’	SMART Enable-Disable Attribute AutoSave:
	This subcommand is used to enable (SC register ≠ 00h) or disable (SC register =
	00h) the setting of the automatic saving feature for the device attribute data. The
	setting is maintained every time the device is turned off and then on. When the
	automatic saving feature is enabled, the attribute values are saved after 15 minutes
	passed since the previous saving of the attribute values. However, if the failure
	prediction feature is disabled, the attribute values are not automatically saved.
	When the device receives this subcommand, it asserts the BSY bit, enables or
	disables the automatic saving feature, then clears the BSY bit.
X’D3’	SMART Save Attribute Values:
	When the device receives this subcommand, it asserts the BSY bit, saves device
	attribute value data, then clears the BSY bit.
X’D4’	SMART Execute off-line Immediate/Execute Self Test:
	The device that received these subcommands shall execute off-line data collection or
	Self Test, or device shall abort current Self Test.
	The setting of SN register is described as following.
	Off-line data collection:	(SN register = 00h)
	Self Test functions:
	- Quick Test – Off-line Mode	(SN register = 01h)
	- Quick Test – Captive Mode	(SN register = 81h)
	- Comprehensive Test – Off-line Mode	(SN register = 02h)
	- Comprehensive Test – Captive Mode	(SN register = 82h)
	- Self Test Stop	(SN register = 7Fh)
	The device that received subcommand (SN register is described 00h, 01h or 02h)
	shall execute Off-line data collection or Self Test after asserts the BSY bit and clears
	it.
	The device that received subcommand (SN register is described 81h or 82h) shall
	execute Self Test after assert the BSY bit, then clears the BSY bit after completes
	these command process.
	The device that received subcommand (SN register is described 7Fh) shall assert the
	BSY bit. When the device is in process of performing Self Test or off-line data
	collection, it should abort the current Self Test or off-line data collection, then clears
	the BSY bit.

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