| Table 5.8 Features Register values (subcommands) and functions (2/2) | |||
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X’D5’ |
| SMART Read Logging Data: |
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| This subcommand is used to transfer logging data that transfer length specified in SC | ||
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| register is to the host. |
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| The setting of SN register is described Log Sector Address below. When SN register | ||
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| is set 00h, 01h, or 06h, SC register should be set to 01h. When SN register is set | ||
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| Directory. |
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| Log Sector Address | 01h (SC register 01h): | SMART Error Log |
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| (See Table 5.12) |
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| 06h (SC register 01h): | SMART Self Test Log |
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| (See Table 5.13) |
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| Host vendor specific | |
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| When the device receives these subcommands, it asserts the BSY bit and transfers | ||
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| logging data to the host, then clears the BSY bit. |
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X’D6’ |
| SMART Write Logging Data: |
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| The device receives the logging data that transfer length specified in SC register from | ||
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| the host. SN register should be set the Log Sector Address below, and SC register | ||
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| should be set 01h to maximum value that shows in the Log Directory. | ||
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| Log Sector Address | Host vendor specific | |
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| When the device receives these subcommands, it asserts the BSY bit and receives | ||
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| logging data from the host, then clears the BSY bit. |
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X’D8’ |
| SMART Enable Operations: |
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| This subcommand enables the failure prediction feature. The setting is maintained | ||
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| even when the device is turned off and then on. |
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| When the device receives this subcommand, it asserts the BSY bit, enables the failure | ||
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| prediction feature, then clears the BSY bit. |
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X’D9’ |
| SMART Disable Operations: |
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| This subcommand disables the failure prediction feature. The setting is maintained | ||
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| even when the device is turned off and then on. |
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| When the device receives this subcommand, it asserts the BSY bit, disables the | ||
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| failure prediction feature, then clears the BSY bit. |
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X’DA’ |
| SMART Return Status: |
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| When the device receives this subcommand, it asserts the BSY bit and saves the | ||
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| current device attribute values. Then the device compares the device attribute values | ||
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| with insurance failure threshold values. If there is an attribute value exceeding the | ||
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| threshold, F4h and 2Ch are loaded into the CL and CH registers. If there are no | ||
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| attribute values exceeding the thresholds, 4Fh and C2h are loaded into the CL and | ||
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| CH registers. After the settings for the CL and CH registers have been determined, | ||
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| the device clears the BSY bit. |
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X’DB’ |
| SMART Enable/Disable Automatic |
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| The device that receives this subcommand enables (SC register ≠ 00h) or disables | ||
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| (SC register = 00h) automatic | ||
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| even when the device is turned off and turned on. |
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| When the failure prediction feature and automatic | ||
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| enabled, an | ||
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| command after more than 4 hours passed since | ||
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| collection. |
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| When the device receives this subcommand, it asserts the BSY bit, enables or | ||
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| disables automatic |
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