-330 | Self-test Failed;Measurement Channel A Fault |
| Refer to “Measurement Assemblies”, on page 2-54 if you require a |
| description of the Measurement Assembly test. |
-330 | Self-test Failed;Measurement Channel B Fault |
| Refer to “Measurement Assemblies”, on page 2-54 if you require a |
| description of the Measurement Assembly test. |
-330 | Self-test Failed;Battery Fault |
| Refer to “Battery”, on page 2-54 if you require a description of the |
| battery test. |
-330 | Self-test Failed;Calibrator Fault |
| Refer to “Calibrator”, on page 2-55 if you require a description of the |
| calibrator test. |
-330 | Self-test Failed;ROM Check Failed |
| Refer to “ROM Checksum”, on page 2-54 if you require a description of |
| the ROM Checksum test. |
-330 | Self-test Failed;RAM Check Failed |
| Refer to “RAM”, on page 2-54 if you require a description of the RAM |
| test. |
-330 | Self-test Failed;Display Assy. Fault |
| Refer to “Display”, on page 2-55 if you require a description of the |
| Display test. |
-330 | Self-test Failed;Confidence Check Fault ChA |
| Refer to “Confidence Check”, on page 2-52 if you require a description of |
| this test. |
-330 | Self-test Failed;Confidence Check Fault ChB |
| Refer to “Confidence Check”, on page 2-52 if you require a description of |
| this test. |
-350 | Queue overflow |
| The error queue is full and another error has occurred which could not |
| be recorded. |
