Test Program for Field.
Subtest 04 | Bit Shift Pattern Test |
| This subtest reads the contents of cache memory and saves it into RAM. The |
| subtest then writes the bit shift data patterns (1 bit shifted every 4 bytes), reads |
| the new data and compares the result with the original data. The original |
| cache memory content is then restored to the cache memory. |
Subtest 05 | Write Disturb Test (We can’t support this time) |
| This subtest reads the contents of cache memory and saves it into RAM. The |
| subtest then writes the “write disturb data,” reads the new data and compares |
| the result with the original data. The original cache memory content is then |
| restored to the cache memory. |
Subtest 06 | Checker Board Test |
| This subtest reads the contents of cache memory and saves it into RAM. The |
| subtest then writes the “checker board data,” (data which is inverted |
| front/back and left/right) reads the new data and compares the result with the |
| original data. The original cache memory content is then restored to the cache |
| memory. |
Subtest 07 | Marching Test |
| This subtest reads the contents of cache memory and saves it into RAM. The |
| subtest then writes the “marching data,” (00H through 01H and 01H through |
| 00H) reads the new data and compares the result with the original data. The |
| original cache memory content is then restored to the cache memory. |
Subtest 08 | Working Data Test |
| This subtest reads the contents of cache memory and saves it into RAM. The |
| subtest then writes the “working data,” reads the new data and compares the |
| result with the original data. The original cache memory content is then |
| restored to the cache memory. |
Satellite T110 and Satellite Pro T110 Tests and Diagnostics Manual | 47 |
