JTAG TESTABILITY
The
AC Characteristics - JTAG Timing
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| 400 MHz CPU |
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| 10 MHz TCK |
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Symbol | Parameter |
| Signals | Conditions | Min | Typ | Max | Units | ||||||
tW |
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| Test reset pulse width |
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| – | – | – | ns | |
(TRST) | TRST |
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tSU (TDI) | Input setup time to TCK |
| TDI |
| – | 3 | – | ns | ||||||
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tSU (TMS) | Input setup time to TCK |
| TMS |
| – | 4 | – | ns | ||||||
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tH(TDI) | Input hold time to TCK |
| TDI |
| – | 1.5 | – | ns | ||||||
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tH(TMS) | Input hold time to TCK |
| TMS |
| – | 1.5 | – | ns | ||||||
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tPD(TDO) | Output delay from TCK [2] |
| TDO | IOL = 8 mA | – | 6 | – | ns | ||||||
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| IOH = |
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tOH(TDO) | Output hold time from TCK [2] |
| TDO | 3 | – | – | ns | |||||||
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| CL = 35 pF |
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| VLOAD = 1.5V |
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1.TRST is an asynchronous reset.
2.TDO is referenced from falling edge of TCK.
22 | Sun Microsystems, Inc | July 1999 |