Toshiba E205 manual Subtest 04 Extended Pattern

3.6 Memory Test 3 Diagnostic Programs

test coverage would be based on the setting and the value in ‘Percent (%) mentioned at below.

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.

Percent (%): Choose the percentage of the defined range of the memory to be tested.

Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested.

Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested.

1.Bit Stuck High Test

Data pattern: Every bit is ‘1’ (Each bit is high)

2.Bit Stuck Low Test

Data pattern: Every bit is ‘0'(Each bit is low);

3.Checker Board Test

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 (0xA);

4.CAS Line Test

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 1111(0xF);

5.Incremental Test

Data pattern: A series of increasing data from 0 by adding 1 each time;

6.Decrement Test

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by subtracting 1 each time;

7.Incremental / Decrement Test

Data Pattern is a series of data whose low byte is increasing data from 0x00 and high byte is decreasing data from 0xFF.

Subtest 04 Extended Pattern

Satellite E200,Satellite Pro E200, EQUIUM E200,SATEGO E200 Maintenance Manual 43