Analog Devices ADSP-2181, ADSP-2183 manual Capacitive Loading, Test Conditions

Models: ADSP-2183 ADSP-2181

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ADSP-2181

CAPACITIVE LOADING

Figures 10 and 11 show the capacitive loading characteristics of the ADSP-2181.

 

30

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

T = +85

°C

 

 

 

 

 

 

 

 

 

 

 

 

 

VDD = 4.5V

 

 

 

 

 

 

 

 

 

 

– ns

25

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2.4V)

20

 

 

 

 

 

 

 

 

 

 

 

 

 

(0.4V–TIME

15

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

RISE

10

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0

50

100

150

200

250

300

 

 

 

 

 

 

 

CL – pF

 

 

 

 

 

 

Figure 10. Typical Output Rise Time vs. Load Capacitance, CL (at Maximum Ambient Operating Temperature)

 

18

 

16

ns

14

 

HOLD

12

10

OR

8

DELAY

6

 

ADSP-2181/ADSP-2183

tDECAY, is dependent on the capacitive load, CL, and the current load, iL, on the output pin. It can be approximated by the fol-

lowing equation:

tDECAY = CL i0.5V L

from which

tDIS = tMEASURED tDECAY

is calculated. If multiple pins (such as the data bus) are dis- abled, the measurement value is that of the last pin to stop driving.

3.0V

INPUT1.5V 0.0V

2.0V

OUTPUT1.5V 0.3V

Figure 12. Voltage Reference Levels for AC Measure- ments (Except Output Enable/Disable)

Output Enable Time

Output pins are considered to be enabled when that have made a transition from a high-impedance state to when they start driving. The output enable time (tENA) is the interval from when a reference signal reaches a high or low voltage level to when the output has reached a specified high or low trip point, as shown in the Output Enable/Disable diagram. If multiple pins (such as the data bus) are enabled, the measurement value is that of the first pin to start driving.

OUTPUT

4

2

NOMINAL

VALID

–2

–4

 

 

–6

0

50

100

150

200

250

CL – pF

Figure 11. Typical Output Valid Delay or Hold vs. Load Capacitance, CL (at Maximum Ambient Operating Temperature)

REFERENCE

SIGNAL

tMEASURED

VOH tDIS

(MEASURED)

VOH (MEASURED) – 0.5V

OUTPUT

VOL (MEASURED) +0.5V

VOL

 

 

 

tDECAY

(MEASURED)

 

 

 

OUTPUT STOPS

DRIVING

tENA

VOH

(MEASURED)

2.0V

1.0V

VOL

(MEASURED)

OUTPUT STARTS

DRIVING

TEST CONDITIONS

Output Disable Time

Output pins are considered to be disabled when they have stopped driving and started a transition from the measured out- put high or low voltage to a high impedance state. The output

disable time (tDIS) is the difference of tMEASURED and tDECAY, as shown in the Output Enable/Disable diagram. The time is the

interval from when a reference signal reaches a high or low volt- age level to when the output voltages have changed by 0.5 V from the measured output high or low voltage. The decay time,

HIGH-IMPEDANCE STATE. TEST CONDITIONS CAUSE

THIS VOLTAGE LEVEL TO BE APPROXIMATELY 1.5V.

Figure 13. Output Enable/Disable

IOL

TO

OUTPUT +1.5V PIN

50pF

IOH

Figure 14. Equivalent Device Loading for AC Measure- ments (Including All Fixtures)

REV. 0

–15–

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Analog Devices ADSP-2181, ADSP-2183 manual Capacitive Loading, Test Conditions