Hitachi HTS543232L9A300 14.17.3Extended Self-testlog sector, 14.17.2.4Device error count, Value

Models: HTS543225L9A300 HTS543232L9A300 HTS543216L9A300 HTS543216L9SA00 HTS543212L9A300 HTS543280L9SA00

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Value

5K320 SATA OEM Specification

State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below.

Value

State

x0h

Unknown

x1h

Sleep

x2h

Standby

x3h

Active/Idle

x4h

SMART Off-line or Self-test

x5h-xAh

Reserved

xBh-xFh

Vendor specific

Note: The value of x is vendor specific.

14.17.2.4Device error count

This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged.

14.17.3Extended Self-test log sector

The following table defines the format of each of the sectors that comprise the Extended SMART self-test log.

The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be included in the Extended SMART self-test log with all 48-bit entries.

Description

Bytes

Offset

Self-test log data structure revision number

1

00h

Reserved

1

01h

Self-test descriptor index (7:0)

1

02h

Self-test descriptor index (15:8)

1

03h

Descriptor entry 1

26

04h

Descriptor entry 2

26

1Eh

...

26

1D8h

Descriptor entry 18

Vendor specific

2

1F2h

Reserved

11

1F4h

Data structure checksum

1

1FFh

 

512

 

Table 79 Extended Self-test log data structure

These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros

14.17.3.1Self-test log data structure revision number

The value of this revision number shall be 01h.

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Hitachi HTS543232L9A300 14.17.3Extended Self-testlog sector, 14.17.2.4Device error count, Value, State, x5h-xAh, xBh-xFh