14.40.7Selective self-testlog data structure

5K320 SATA OEM Specification

14.40.7Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering.

Description	Bytes	Offset	Read/Write
Data structure revision	2	00h	R/W
Starting LBA for test span 1	8	02h	R/W
Ending LBA for test span 1	8	0Ah	R/W
Starting LBA for test span 2	8	12A	R/W
Ending LBA for test span 2	8	1Ah	R/W
Starting LBA for test span 3	8	22h	R/W
Ending LBA for test span 3	8	2Ah	R/W
Starting LBA for test span 4	8	32h	R/W
Ending LBA for test span 4	8	3Ah	R/W
Starting LBA for test span 5	8	42h	R/W
Ending LBA for test span 5	8	4Ah	R/W
Reserved	256	52h	Reserved
Vendor specific	154	152h	Vendor specific
Current LBA under test	8	1ECh	Read
Current span under test	2	1F4h	Read
Feature flags	2	1F6	R/W
Vendor specific	4	1F8h	Vendor specific
Selective self test pending time	2	1FCh	R/W
Reserved	1	1FEh	Reserved
Data structure checksum	1	1FFh	R/W
	512

Table 123 Selective self-test log data structure

14.40.8Error Reporting

The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device.

Error Condition

A S.M.A.R.T. FUNCTION SET command was received by the device without the required key being loaded into the LBA High and LBA Mid registers.

A S.M.A.R.T. FUNCTION SET command was received by the device with a subcommand value in the Features Register that is either invalid or not supported by this device.

A S.M.A.R.T. FUNCTION SET command subcommand other than S.M.A.R.T. ENABLE OPERATIONS was received by the device while the device was in a “S.M.A.R.T. disabled” state.

The device is unable to read its Attribute Values or Attribute Thresholds data structure.

The device is unable to write to its Attribute Values data structure.