Manuals / Texas Instruments / Computer Equipment / Computer Drive

Texas Instruments TMS320F20x/F24x DSP manual Literature Number SPRU282 September

Models: TMS320F20x/F24x DSP

1 108

Download 108 pages 2.5 Kb

Page 1

Image 1

TMS320F20x/F24x DSP

Embedded Flash Memory

Technical Reference

This document contains preliminary data current as of publication date and is subject to change without notice.

Literature Number: SPRU282

September 1998

Printed on Recycled Paper

Page 1

Image 1

Texas Instruments manual TMS320F20x/F24x DSP Embedded Flash Memory Technical Reference, Printed on Recycled Paper

Contents

Literature Number SPRU282 September TMS320F20x/F24x DSP Embedded Flash Memory Technical ReferencePrinted on Recycled Paper IMPORTANT NOTICE Read This First How to Use This ManualPRELIMINARY About This ManualNotational Conventions PRELIMINARYPRELIMINARY This document uses the following conventionsPRELIMINARY Related Documentation From Texas InstrumentsPRELIMINARY PRELIMINARY TMS320C2xx C Source Debugger Users Guide literature number SPRU151 tells you how to invoke the C2xx emulator and simulator ver- sions of the C source debugger interface. This book discusses various aspects of the debugger interface, including window management, com- mand entry, code execution, data management, and breakpoints. It also includes a tutorial that introduces basic debugger functionalityPRELIMINARY World-Wide Web Sites If You Need AssistanceNorth America, South America, Central America Europe, Middle East, AfricaPRELIMINARY PRELIMINARY1 Introduction Contents2 Flash Operations and Control Registers A.1.1 Header File for Constants and Variables, SVAR20.H . . . . . . . . . . . . . . . . . . . . . A2 A.1.2 Clear Algorithm, SCLR20.ASM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A5 A.1.3 Erase Algorithm, SERA20.ASM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A10 A.1.4 Flash-Write Algorithm, SFLW20.ASM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A15 A.1.5 Programming Algorithm, SPGM20.ASM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A19 A.1.6 Subroutines Used By All Four Algorithms, SUTILS20.ASM . . . . . . . . . . . . . . . A25 Figures 2±1 Operations that Modify the Contents of the Flash Array Tables1±1 TMS320 Devices With On-Chip Flash EEPROM 2±2 Flash Module Control RegistersChapter IntroductionPage TopicPRELIMINARY 1.1 Basic Concepts of Flash Memory TechnologyPRELIMINARY Table 1±1. TMS320 Devices With On-Chip Flash EEPROM 1.2 TMS320F20x/F24x Flash ModulePRELIMINARY PRELIMINARYPRELIMINARY Figure 1±1. TMS320F20x/F24x Program Space Memory MapsPRELIMINARY TMS320F20x/F24x Flash ModulePRELIMINARY 1.3 Benefits of Embedded Flash Memory in a DSP SystemPRELIMINARY PRELIMINARY PRELIMINARYPage TopicFlash Operations and Control Registers ChapterPRELIMINARY 2.1 Operations that Modify the Contents of the F20x/F24x Flash ArrayPRELIMINARY PRELIMINARY This procedure is discussed in complete detail in ChapterPRELIMINARY Figure 2±1. Flash Memory Logic Levels During Programming and Erasing Table 2±1. Operations that Modify the Contents of the Flash ArrayOperations that Modify the Contents of the F20x/F24x Flash Array PRELIMINARYPRELIMINARY 2.2 Accessing the Flash ModulePRELIMINARY 2.2.1 TMS320F206 Flash Access-Control Register Figure 2±2. Memory Maps in Register and Array Access ModesPRELIMINARY PRELIMINARYPRELIMINARY 2.2.2 TMS320F24x Flash Access-Control RegisterPRELIMINARY Table 2±2. Flash Module Control Registers 2.3 Flash Module Control Registers2.3.1 Segment Control Register SEGCTR Figure 2±3. Segment Control Register SEGCTRPRELIMINARY Table 2±3. Segment Control Register Field DescriptionsPRELIMINARY Flash Module Control Registers2.3.2 Flash Test Register TST Table 2±4. Flash Array Segments Summary2.3.3 Write Address Register WADRS PRELIMINARYPRELIMINARY 2.3.4 Write Data Register WDATAPRELIMINARY PRELIMINARY 2.4 Read ModesPRELIMINARY PRELIMINARY 2.5 Program OperationPRELIMINARY PRELIMINARY 2.6 Erase OperationPRELIMINARY Erase OperationPRELIMINARY 2.7 Recovering From Over-Erasure Flash-Write OperationPRELIMINARY 2.9 Protecting the Array 2.8 Reading From the Flash ArrayPRELIMINARY PRELIMINARYChapter Algorithm Implementations and Software ConsiderationsPRELIMINARY PRELIMINARYPRELIMINARY 3.1 How the Algorithms Fit Into the Program-Erase-Reprogram FlowPRELIMINARY How the Algorithms Fit Into the Program-Erase-Reprogram FlowPRELIMINARY Figure 3±1. Algorithms in the Overall FlowPRELIMINARY How the Algorithms Fit Into the Program-Erase-Reprogram FlowFigure 3±2. The Programming Algorithm in the Overall Flow 3.2 Programming or Clear AlgorithmPRELIMINARY PRELIMINARYPRELIMINARY The main feature of the program/clear algorithm is the concept of program- ming an entire row of bits in a group. The F20x/F24x flash array is organized in rows of 32 words. That is, addresses 0000h through 001Fh are physically located on the same row of the flash memory array. The array is designed so that there is a dependence between the charge levels on adjacent even±odd addresses during programming. Programming the bits of an odd address re- duces the charge margin of the programmed bits the 0s in the preceding ad- jacent even address within the row. Similarly, programming the bits of an even address reduces the charge margin of the programmed bits in the next adjacent odd address within the row. Because of this dependence, if each address is programmed individually, the charge levels among programmed bits is not uniform. The programming algorithm improves the uniformity of charge levels on programmed bits by programming all of the words of a row in a group. For example, the contents of address 0000h is compared with the data to be programmed and one program pulse is applied if necessary. The same procedure is performed on addresses 0001h through 001Fh. The proce- dure repeats starting at address 0000h until no more program pulses are re- quired for any address in the row. The number of iterations of this loop equals the maximum number of program pulses required to program the bits in the rowPRELIMINARY PRELIMINARY Figure 3±3. Programming or Clear Algorithm FlowPRELIMINARY Programming or Clear AlgorithmPRELIMINARY Power up the VCCP pinPRELIMINARY PRELIMINARY PRELIMINARYProgramming or Clear Algorithm PRELIMINARY Before each program pulse is applied, a read of the byte is performed to deter- mine which bits have reached the programmed level. Any bits that have reached the programmed level are masked set to 1 in the WDATA register. This method of programming provides uniform charge levels among pro- grammed bits, whereas using a single, long program pulse could result in some bits having much more charge than others. The uniformity of charge lev- els among bits has the primary effect of reducing programming time and the secondary effect of reducing the time for a subsequent erase operation. To as- sure that the bits are programmed with enough margin, the reads associated with programming use the VER0 read modePRELIMINARY Figure 3±4. Erase Algorithm in the Overall Flow 3.3 Erase AlgorithmPRELIMINARY PRELIMINARYPRELIMINARY Table 3±2. Steps for Applying One Erase PulsePRELIMINARY PRELIMINARY 4 The actual address is restoredPRELIMINARY PRELIMINARY Figure 3±5. Erase Algorithm FlowPRELIMINARY Erase AlgorithmFigure 3±6. Flash-Write Algorithm in the Overall Flow 3.4 Flash-Write AlgorithmPRELIMINARY PRELIMINARYPRELIMINARY Table 3±3. Steps for Applying One Flash-Write PulsePRELIMINARY PRELIMINARY Figure 3±7. Flash-Write Algorithm FlowPRELIMINARY Flash-Write AlgorithmPRELIMINARY The CPU frequency range for the application is an important consideration for the depletion test, as well as for the program and erase operations. Because of the actual implementation of the flash memory circuitry, a bit in depletion mode is most easily detected at low frequency. Accordingly, if the application requires a variable CPU clock rate, the depletion test should be performed at the lowest frequency in the range. Only the read portion of the depletion test must be performed at the lower frequency, because it is the read that is used to detect depletion. The effective duration of the read operation can be ex- tended by sequentially executing multiple reads on the same location. Be- cause the same address is selected the entire time and internal control signals are maintained between reads, the final read is equivalent to a slow read. For example, if the DSP core is executing the programming algorithm at a CLKOUT rate of 20 MHz 50 ns, sequentially reading a location three times is equivalent to reading it once at 6.67 MHz 150 ns. The erase and flash-write algorithm implementations given in Appendix A use three reads to check for depletionPRELIMINARY PRELIMINARY PRELIMINARYAppendixAppendixAA Assembly Source Listings and Program ExamplesPRELIMINARY PRELIMINARYA.1.1 Header File for Constants and Variables, SVAR20.H A.1 Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYAssembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY PRELIMINARY A.1.2 Clear Algorithm, SCLR20.ASMPRELIMINARY PRELIMINARY Assembly Source for AlgorithmsPRELIMINARY Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY A.1.3 Erase Algorithm, SERA20.ASMPRELIMINARY A-10Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-12Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-14PRELIMINARY A.1.4 Flash-Write Algorithm, SFLW20.ASMPRELIMINARY PRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-16Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-18PRELIMINARY A.1.5 Programming Algorithm, SPGM20.ASMPRELIMINARY PRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-20Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-22Assembly Source Listings and Program Examples Assembly Source for AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-24Assembly Source for Algorithms A.1.6 Subroutines Used By All Four Algorithms, SUTILS20.ASMAssembly Source Listings and Program Examples PRELIMINARYPRELIMINARY Assembly Source for AlgorithmsPRELIMINARY A-26Assembly Source Listings and Program Examples A.2 C-Callable Interface to Flash AlgorithmsPRELIMINARY PRELIMINARYPRELIMINARY PRELIMINARYC-Callable Interface to Flash Algorithms A-28PRELIMINARY Assembly Source Listings and Program ExamplesPRELIMINARY C-Callable Interface to Flash AlgorithmsPRELIMINARY PRELIMINARYC-Callable Interface to Flash Algorithms A-30PRELIMINARY Assembly Source Listings and Program ExamplesPRELIMINARY C-Callable Interface to Flash AlgorithmsA.3.1 Assembly Code for TMS320F206 A.3 Sample Assembly Code to Erase and Reprogram the TMS320F206PRELIMINARY PRELIMINARYPRELIMINARY PRELIMINARYPRELIMINARY PRELIMINARYA-34 Assembly Source Listings and Program Examples Sample Assembly Code to Erase and Reprogram the TMS320F206PRELIMINARY PRELIMINARYPRELIMINARY Sample Assembly Code to Erase and Reprogram the TMS320F206PRELIMINARY A-36PRELIMINARY A.4 Sample C Code to Erase and Reprogram the TMS320F206PRELIMINARY PRELIMINARY A.4.2 Linker Command File for TMS320F206 Sample C CodePRELIMINARY Sample C Code to Erase and Reprogram the TMS320F206PRELIMINARY Assembly Source Listings and Program ExamplesPRELIMINARY Sample C Code to Erase and Reprogram the TMS320F206A.5.1 Assembly Code for TMS320F240 A.5 Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY PRELIMINARYAssembly Source Listings and Program Examples Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY PRELIMINARYPRELIMINARY Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY A-42Assembly Source Listings and Program Examples Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY PRELIMINARYPRELIMINARY Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY A-44Sample Assembly Code to Erase and Reprogram the TMS320F240 A.5.2 Linker Command File for TMS320F240 Sample Assembly CodeAssembly Source Listings and Program Examples PRELIMINARYPRELIMINARY Sample Assembly Code to Erase and Reprogram the TMS320F240PRELIMINARY A-46PRELIMINARY A.6 Using the Algorithms With C Code to Erase and Reprogram the F240PRELIMINARY Rev1.003/98 JGCUsing the Algorithms With C Code to Erase and Reprogram the F240 A.6.2 Linker Command File for TMS320F240 Sample C CodePRELIMINARY PRELIMINARYAssembly Source Listings and Program Examples Using the Algorithms With C Code to Erase and Reprogram the F240PRELIMINARY PRELIMINARYUsing the Algorithms With C Code to Erase and Reprogram the F240 A.6.3 C Function for Disabling TMS320F240 Watchdog TimerPRELIMINARY PRELIMINARYUsing the Algorithms With C Code to Erase and Reprogram the F240 A.6.4 C Functions for Initializing the TMS320F240Assembly Source Listings and Program Examples PRELIMINARYPRELIMINARY Using the Algorithms With C Code to Erase and Reprogram the F240PRELIMINARY A-52PRELIMINARY IndexPRELIMINARY IndexPRELIMINARY PRELIMINARYIndex PRELIMINARY PRELIMINARYIndex PRELIMINARY PRELIMINARYIndex