PRELIMINARY

Operations that Modify the Contents of the 'F20x/F24x Flash Array

This procedure is discussed in complete detail in Chapter 3.

During these operations that are used to modify the contents of the flash array, three special read modes, and a corresponding set of reference voltage levels, are used when reading back data values to verify programming and erase op- erations.

These read modes and reference levels are:

-VER0 ± which is used to verify the logic zero level including margin,

-VER1 ± which is used to verify the logic one level including margin, and

-Inverse Erase ± which is used to verify depletion recovery.

These concepts are illustrated graphically in Figure 2±1 and summarized in Table 2±1.

Note that ONLY the Erase and the Flash-Write functions are truly ªflashº in the sense that these functions actually affect all bits in the array simultaneously. In contrast, bit programming levels in the Program and Clear functions can be controlled individually on a bit-by-bit basis.

Therefore, when using the Erase or Flash-Write functions, the whole array is modified, and then the whole array is read, word by word, to verify whether all words have reached the same value (if not, further iterations of the Erase or Flash-Write functions continue).

In these cases, as mentioned previously, all the bits in the array are modified simultaneously, but some bits may react more quickly, potentially resulting in variation in actual levels on different bits. Therefore, when performing an Erase, it is possible that some bits may reach depletion even before other bits reach the logic one reference level (VER1).

The reason that it is critical to clear the array to a consistent zero level before erasing the array is to give maximum immunity to depletion when erasing. Note, however, that even when following this sequence, some flash arrays may experience depletion, and may require recovery using the Flash-Write function.

In contrast to the true ªflashº operations Erase and Flash-Write, after each in- cremental Program or Clear operation, each bit is tested against the VER0 ref- erence level to determine the exact point at which it has reached the proper value, following which, no further incremental adjustment of the level is made on that bit. Therefore, when the Program or Clear operation is complete, all bits are at the same zero level, which greatly increases proper data retention and depletion immunity for the device. Again, note that the programming and erase operations are discussed in complete detail in Chapter 3.

PRELIMINARY

Flash Operations and Control Registers

2-3

Page 21
Image 21
Texas Instruments TMS320F20x/F24x DSP manual Flash Operations and Control Registers