Index

B

Binary block 26

Brightness 186, 187

C

Channel Numbers 26

Command summary 44

Common commands 29

Compatibility 246

Continuous measurement 88, 89

Contrast 186

Coordination of modules example 199

D

Data Types 26

Date 76

Display

brightness 186, 187

LCD 187

Lockout 187

display contrast 186

Display Operations 186

DISPlay Subsystem 186

E

Error handling

230

 

 

Error strings

 

 

 

GPIB 258

 

 

 

Event register

 

 

 

operation enable

66, 67, 69, 73

questionable enable 72, 75

Event Status Enable

 

58

Event Status Register

58

F

 

 

 

 

 

FETCh subsystem

87

Fixed Laser Source

 

 

Set up example

192

G

 

 

 

 

 

 

 

GPIB Interface

16

 

 

H

 

 

 

 

 

 

 

Agilent VEE 218

I

Identification 59

IEEE-Common Commands 56

INITiate subsystem 88

Input queue 20

Installed options

60

 

 

Instrument addresses

232

 

Instrument Behaviour Settings

76

Instrument driver

225

 

Instrument driver installation

214

Interface

 

 

 

 

 

behaviour settings

76

 

L

 

 

 

 

 

 

 

 

 

 

 

LabView

221

 

 

 

 

LabWindows

224

 

 

 

Lambda scan

 

 

 

 

execute function

238

 

get parameters function 238

get result function

242

 

mult-frame

241

 

 

prepare function

237

 

Lambda scans

235

 

 

Laser

 

 

 

 

 

state

127

 

 

 

 

switch on

127

 

 

Laser Selection Numbers 27

 

LCD 187

 

 

 

 

 

Local control

18

 

 

 

LOCK subsystem 80

M

Measurement start 88

Measurement Functions 85

Message queues 19

O

Operation Complete

60

 

Operation enable 66, 67,

69, 73

Options 60

 

 

Output queue 21

 

 

OUTPut subsystem

113,

148

P

Power measurement

example of FETCh and READ usage 195

Power Meter

continuous measurement 88 start measurement 88

Power meter configure all 90 continuous measurement 89 current value 90

read all 89

Power variation with wavelength 203

Q

Questionable enable 72, 75

R

READ subsystem

91

 

Register

 

 

 

Operational Slot Status

38

Questionable slot status

38

Standard Event Status

37

Status byte

37

 

 

Status summary

38

 

register mainframe

240

 

Reset 61

 

 

 

Return Loss

current monitor value 91 current value 91

Root layer commands 80

S

SCPI revision 78

Self-test 62

SENSe subsystem 92

Signal conditioning 148

Signal condtioning 148

Signal generation 113

Slot Numbers 26

SLOT subsystem 81

SOURce subsystem 113

SPECial subsystem

84

 

Specific Command Summary

44

Start

 

 

laser 127

 

 

measurement

88

 

power meter measurement 88

Status Byte 61

 

 

Status Command Summary

40

Status Information

31

 

Agilent 8163A/B, 8164A/B & 8166A/B Mainframes, Sixth Edition

271

Page 270 Page 272
Page 271
Image 271
Agilent Technologies 8164A, B, 8166A, 8163A manual Index, 271
Page 270 Page 272

8163A, 8164A, 8166A, B specifications

Agilent Technologies B,86100A is a high-performance oscilloscope and signal integrity analyzer designed primarily for advanced digital communications applications. As a versatile tool, it supports a wide range of testing needs, making it indispensable for engineers and researchers involved in the development and testing of high-speed digital signals.

One of the standout features of the B,86100A is its capability to analyze signals with various bandwidths, accommodating both current and emerging communication standards. The device features a sampling rate of up to 80 GS/s and bandwidth capabilities of 33 GHz to ensure high accuracy in capturing fast signal transitions, which is critical for ensuring the integrity of complex digital signals.

The B,86100A employs Agilent's proprietary digital signal processing (DSP) technology, which significantly enhances measurement precision and reduces noise, enabling users to obtain clearer insights into signal behavior. Its advanced triggering capabilities allow for precise signal capture, making it particularly useful in troubleshooting and validating high-speed designs, as well as in evaluating the performance of optical and electrical devices.

In addition to its high-speed capabilities, the B,86100A offers a robust set of measurement tools including jitter analysis, eye diagram analysis, and equalization assessment. These features allow engineers to effectively analyze signal quality and address potential issues related to signaling distortions and inter-symbol interference.

The graphical user interface of the B,86100A is intuitive, enabling users to efficiently navigate through measurement options and visualize data results. Customizable measurement setups streamline workflow, ensuring that users can quickly adapt their tests to evolving project requirements.

Another key characteristic of the B,86100A is its modularity. The system supports a variety of plug-in modules, which can be tailored to specific application needs, such as different types of optical and electrical signals. This flexibility not only extends the operational capability of the instrument but also makes it a future-proof investment as technology continues to evolve.

In summary, Agilent Technologies B,86100A combines high-speed acquisition with advanced processing capabilities, making it an essential instrument for anyone involved in high-speed digital design and testing. With its ability to deliver precise measurements and extensive analysis features, it empowers engineers to achieve optimal performance and reliability in their systems.
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