8

GPIB Command Compatibility List

This chapter gives information about adapting programs developed for use with HP 8153A Lightwave Multimeter or HP 8167B/8D/8E/8F Tunable Laser Source.

Compatibility Issues. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 246

GPIB Bus Compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 246

Status Model. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 247

Preset Defaults . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 248

Removed Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 249

Obsolete Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 250

Changed Parameter Syntax and Semantics . . . . . . . . . . . 251

Changed Query Result Values . . . . . . . . . . . . . . . . . . . . . . 252

Timing Behavior . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253

Error Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 254

Command Order . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 255

Instrument Status Settings. . . . . . . . . . . . . . . . . . . . . . . . . 256

Agilent 8163A/B, 8164A/B & 8166A/B Mainframes, Fifth Edition

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Agilent Technologies 8164A, B, 8166A, 8163A manual Gpib Command Compatibility List, 245

8163A, 8164A, 8166A, B specifications

Agilent Technologies B,86100A is a high-performance oscilloscope and signal integrity analyzer designed primarily for advanced digital communications applications. As a versatile tool, it supports a wide range of testing needs, making it indispensable for engineers and researchers involved in the development and testing of high-speed digital signals.

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The B,86100A employs Agilent's proprietary digital signal processing (DSP) technology, which significantly enhances measurement precision and reduces noise, enabling users to obtain clearer insights into signal behavior. Its advanced triggering capabilities allow for precise signal capture, making it particularly useful in troubleshooting and validating high-speed designs, as well as in evaluating the performance of optical and electrical devices.

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