CY7C1380C
CY7C1382C
Document #: 38-05237 Rev. *D Page 17 of 36
Note that since the PRELOAD part of the command is not
implemented, putting the TAP to the Update-DR state while
performing a SAMPLE/PRELOAD instruction will have the
same effect as the Pause-DR command.
BYPASS
When the BYPASS instruction is loaded in the instruction
register and the TAP is placed in a Shift-DR state, the bypass
register is placed between the TDI and TDO balls. The
advantage of the BYPASS instruction is that it shortens the
boundary scan path when multiple devices are connected
together on a board.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
TAP Timing TAP AC Switching Characteristics Over the operating Range[9, 10]Parameter Symbol Min Max Units
Clock
TCK Clock Cycle Time tTCYC 100 ns
TCK Clock Frequency tTF 10 MHz
TCK Clock HIGH time tTH 40 ns
TCK Clock LOW time tTL 40 ns
Output Times
TCK Clock LOW to TDO Valid tTDOV 20 ns
TCK Clock LOW to TDO Invalid tTDOX 0ns
Setup Times
TMS Set-Up to TCK Clock Rise tTMSS 10 ns
TDI Set-Up to TCK Clock Rise tTDIS 10 ns
Capture Set-Up to TCK Rise tCS 10
Hold Times
TMS hold after TCK Clock Rise tTMSH 10 ns
TDI Hold after Clock Rise tTDIH 10 ns
Capture Hold after Clock Rise tCH 10 ns
Notes:
9. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
10.Test conditions are specified using the load in TAP AC test Conditions. tR/tF = 1ns.
tTL
Test Clock
(TCK)
123456
T
est Mode Select
(TMS)
tTH
Test Data-Out
(TDO)
tCYC
Test Data-In
(TDI)
tTMSH
tTMSS
tTDIH
tTDIS
tTDOX
tTDOV
DON’T CARE UNDEFINED
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