Interface
Table 5.7 Features Register values (subcommands) and functions (1 of 3)
Features Resister |
|
| Function | |
X’D0’ | SMART Read Attribute Values: | |||
| A device that received this subcommand asserts the BSY bit and saves all | |||
| the updated attribute values. The device then clears the BSY bit and | |||
| transfers | |||
| * For infomation about the format of the attribute value information, see | |||
|
| Table 5.8. | ||
X’D1’ | SMART Read Attribute Thresholds: | |||
| This subcommand is used to transfer | |||
| value data to the host. | |||
| * For infomation about the format of the insurance failure threshold value | |||
|
| data, see Table 5.9. | ||
X’D2’ | SMART | |||
| This subcommand is used to enable (SC register ≠ 00h) or disable (SC | |||
| register = 00h) the setting of the automatic saving feature for the device | |||
| attribute data. The setting is maintained every time the device is turned off | |||
| and then on. When the automatic saving feature is enabled, the attribute | |||
| values are saved before the device enters the power saving mode. However, | |||
| if the failure prediction feature is disabled, the attribute values are not | |||
| automatically saved. | |||
| When the device receives this subcommand, it asserts the BSY bit, enables | |||
| or disables the automatic saving feature, then clears the BSY bit. | |||
X’D3’ | SMART Save Attribute Values: | |||
| When the device receives this subcommand, it asserts the BSY bit, saves | |||
| device attribute value data, then clears the BSY bit. | |||
X’D4’ | SMART Executive | |||
| A device which receives this command asserts the BSY bit, then starts | |||
| collecting the | |||
| In the | |||
| captive mode, it collects | |||
| clears the BSY when collection of data is completed. | |||
|
| SN |
| |
|
| 00h: | ||
|
| 01h: Simple self test | ||
|
| 02h: | Comprehensive self test | |
|
| 7Fh: | Self test stop | |
|
| 81h: Simple self test (captive mode) | ||
|
| 82h: Comprehensive self test (captive mode) |