Interface

Table 5.7 Features Register values (subcommands) and functions (2 of 3)

Features Resister

 

 

Function

X’D5’

SMART Read Log Sector:

 

A device which receives this sub-command asserts the BSY bit, then reads

 

the log sector specified in the SN register. Next, it clears the BSY bit and

 

transmits the log sector to the host computer.

 

 

SN:

Log sector

 

 

00:

SMART log directory

 

 

01h:

SMART error log

 

 

06h:

SMART self test log

 

 

80h-9Fh: Host vendor log

 

* See Table 5.10 concerning the SMART error log data format.

 

 

See Table 5.11 concerning the SMART self test log data format.

X’D6’

SMART Write Log Sector:

 

A device which receives this sub-command asserts the BSY bit and when it

 

has prepared to receive data from the host computer, it sets DRQ and clears

 

the BSY bit. Next, it receives data from the host computer and writes the

 

specified log sector in the SN register.

 

 

SN:

Log sector

 

 

80h-9Fh: Host vendor log

 

* The host can write any desired data in the host vendor log.

X’D8’

SMART Enable Operations:

 

This subcommand enables the failure prediction feature. The setting is

 

maintained even when the device is turned off and then on.

 

When the device receives this subcommand, it asserts the BSY bit, enables

 

the failure prediction feature, then clears the BSY bit.

X’D9’

SMART Disable Operations:

 

This subcommand disables the failure prediction feature. The setting is

 

maintained even when the device is turned off and then on.

 

When the device receives this subcommand, it asserts the BSY bit, disables

 

the failure prediction feature, then clears the BSY bit.

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Fujitsu MHN2300AT, MHN2150AT, MHN2100AT, MHN2200AT manual Features Register values subcommands and functions 2