Interface
Table 5.7 Features Register values (subcommands) and functions (2 of 3)
Features Resister |
|
| Function | |
X’D5’ | SMART Read Log Sector: | |||
| A device which receives this | |||
| the log sector specified in the SN register. Next, it clears the BSY bit and | |||
| transmits the log sector to the host computer. | |||
|
| SN: | Log sector |
|
| 00: | SMART log directory | ||
|
| 01h: | SMART error log | |
|
| 06h: | SMART self test log | |
|
| |||
| * See Table 5.10 concerning the SMART error log data format. | |||
|
| See Table 5.11 concerning the SMART self test log data format. | ||
X’D6’ | SMART Write Log Sector: | |||
| A device which receives this | |||
| has prepared to receive data from the host computer, it sets DRQ and clears | |||
| the BSY bit. Next, it receives data from the host computer and writes the | |||
| specified log sector in the SN register. | |||
|
| SN: | Log sector | |
|
| |||
| * The host can write any desired data in the host vendor log. | |||
X’D8’ | SMART Enable Operations: | |||
| This subcommand enables the failure prediction feature. The setting is | |||
| maintained even when the device is turned off and then on. | |||
| When the device receives this subcommand, it asserts the BSY bit, enables | |||
| the failure prediction feature, then clears the BSY bit. | |||
X’D9’ | SMART Disable Operations: | |||
| This subcommand disables the failure prediction feature. The setting is | |||
| maintained even when the device is turned off and then on. | |||
| When the device receives this subcommand, it asserts the BSY bit, disables | |||
| the failure prediction feature, then clears the BSY bit. |