Si53xx-RM

Table 9. Jitter Generation (Si5316, Si5324, Si5366, Si5368)

Parameter

Symbol

Test Condition1,2,3,4,5

Min

Typ

Max

GR-253 Spec

Unit

 

 

Measurement

DSPLL

 

 

 

 

 

 

 

Filter (MHz)

Bandwidth2

 

 

 

 

 

 

 

0.02–80

120 Hz

4.2

6.2

30 ps pp/0.3 UIpp

psPP

 

 

 

 

.27

.42

N/A

psrms

 

 

4–80

120 Hz

3.7

6.4

10 ps pp/0.1 UIpp

psPP

Jitter Gen OC-192

JGEN

 

 

 

 

 

 

 

 

 

.14

.31

N/A

psrms

 

 

0.05–80

120 Hz

4.4

6.9

10 ps pp/0.1 UIpp

psPP

 

 

 

 

.26

.41

1.0 psrms

psrms

 

 

 

 

 

 

 

(0.01 UIrms

 

 

 

0.012–20

120 Hz

3.5

5.4

40.2 ps pp/

psPP

Jitter Gen OC-48

JGEN

 

 

 

 

 

(0.1 UIpp)

 

 

 

 

 

 

 

 

 

 

.27

.41

4.02 psrms

psrms

 

 

 

 

 

 

 

(0.01 UIrms

 

Notes:

 

 

 

 

 

 

 

 

1.Test condition: fIN = fOUT = 622.08 MHz, LVPECL clock input: 1.19 Vppd with 0.5 ns rise/fall time (20–80%), LVPECL clock output.

2.BWSEL [1:0] loop bandwidth settings provided in Pin Descriptions.

3.114.285 MHz 3rd OT crystal used as XA/XB input.

4.VDD = 2.5 V

5.TA = 85 °C

Table 10. Jitter Generation (Si5322, Si5325, Si5365, Si5367)

Parameter

Symbol

Test Condition1,2

Min

Typ

Max

Unit

 

 

Measurement

DSPLL

 

 

 

 

 

 

Filter (MHz)

Bandwidth2

 

 

 

 

 

 

 

(kHz)

 

 

 

 

 

 

 

 

 

 

 

 

Jitter Gen OC-192

JGEN

0.02–80

1096

.49

psrms

 

 

4–80

1096

.23

psrms

 

 

0.05–80

1096

.47

psrms

Jitter Gen OC-48

JGEN

0.012–20

1096

.48

psrms

Notes:

 

 

 

 

 

 

 

1.Test condition: fIN = fOUT = 622.08 MHz, LVPECL clock input: 1.19 Vppd with 0.5 ns rise/fall time (20–80%), LVPECL clock output.

2.BWSEL [1:0] loop bandwidth settings provided in Pin Descriptions.

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Silicon Laboratories SI5325, SI5369, SI5365, SI5366, SI5367, SI5374, SI5375 Jitter Generation Si5316, Si5324, Si5366, Si5368