ADTRAN 1202076L2#DC, 1202076L1#DC user manual Pattern Result, Bes, Ses, Sync

Chapter 7. Test Menu

Pattern Result

Displays the results of the test currently active. Leaving and returning to this menu item does not interrupt the test.

Pressing 2 injects errors into the test pattern. These errors are detected by the device performing the pattern check.

Pattern	Description
ES	The number of seconds with at least 1 bit error
BES	The number of seconds with more than 1 bit
	error and less than 320
SES	The number of seconds with more than 320 bit
	errors
SYNC	Indicates if pattern sync is (yes) or is not (no)
	valid. An asterisk (*) indicates if pattern sync
	has been lost since the start of testing

Clear results by pressing Shift 9. The results are accumulated until the test pattern is set to None or Cleared.

Using TST DS0s for testing can be very useful, particularly in Fractional T1 applications. You can run an end-to-end test on the Fractional DS0s by:

1

2

Setting for Map B the TST in the same DS0 as used by Map A to receive data from an Nx56/64 port, and

Looping the far end using a V.54 loopback code on the Nx56/64 port. In addition, a single DS0 can be used for continuous testing while other DS0s are passing normal data.

This will also provide an end-to-end check on the entire link. Set each end to send QRSS in TST DS0s (using 1 DS0) and occasionally view the results on the Pattern Result Menu selection.

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