Agilent Technologies E1564A, E1563A user manual Bit #

Self-Test Error Definitions: A failed self-test will return a number other than zero. The binary value of that number defines the failure mode. More than one failure mode may result from one self-test. The failure modes are defined in the following sections for each type of self-test. Bits and their weighting are:

bit #	7	6	5	4	3	2	1	0
weight	128	64	32	16	8	4	2	1

Offset Noise Test (self-test numbers 3 - 58)

BCD weight	Failure mode
1	Span is zero
2	Span is too large
4	Mean is too low
8	Mean is too high
16	Standard deviation is too large

Offset DAC Test (self-test numbers 59-62) (E1564A 4-Channel Digitizer)

BCD weight	Failure mode
1	DAC measurement is noisy
2	Measured data span is too small
4	Lower end point to upper end point span is too small
8	Lower end point to upper end point span is too large
16	Offset DAC span does not include 0
32	Bit weight is out of limits; the offending bit is in B15-B8.

Gain DAC Test (self-test numbers 63-66) (E1564A 4-Channel Digitizer)

BCD weight	Failure mode
1	DAC measurement is noisy
2	Measured data span is too small
4	Lower end point to upper end point span is too small
8	Lower end point to upper end point span is too large
16	Gain DAC span does not include 0
32	Bit weight is out of limits; the offending bit is in B15-B8.
64	Gain DAC nominal setting is out of limits.

102 Digitizers Command Reference Chapter 3