1-111

Making Measurements

Using Test Sequencing

Table1-5 Test Set Interconnect Pin Designation
Pin Number Pin Description
Pin 1 No Connection (NC)
Pin 2 Sweep delay: holds off sweeps until test set has finished swee ping (85046A/B and 85047B
only)
Pin 3 Same as Test Sequence (TTL OUT) output BNC connector
Pin 4 NC
Pin 5 NC
Pin 6 NC
Pin 7 Ground
Pin 8 Hi-forward/Low-reverse. F ollows the test port indicator.
Pin 9 NC
Pin 10 Lstarttrig: Not used. Do not connect anything to this pin.
Pin 11 TESTSET I/O Bit 2 (most significant bit). +5 V when TESTSET I/O has values of 4, 5, 6, or
7. Otherwise, bit is TTL low.
Pin 12 Ground
Pin 13 NC
Pin 14 +22 Volts
Pin 15 NC
Pin 16 NC
Pin 17 Same as Limit Test output BNC connector
Pin 18 Ground
Pin 19 NC
Pin 20 NC
Pin 21 Ground
Pin 22 TESTSET I/O Bit 0 (least significant bit). +5 V when TESTSET I/O has values of 1, 3, 5, or
7. Otherwise, bit is TTL low.
Pin 23 TESTSET I/O Bit 1 (middle bit). +5 V when TESTSET I/O has values of 2, 3, 6, or 7.
Otherwise, bit is TTL low.
Pin 24 Lremtrig: TTL low when TEST- SET I/O pins are valid. This bit can be used to latch these
values.
Pin 25 NC