5-13
Optimizing Measurement Results
Increasing Sweep Speed
To View a Single Measurement Channel
Viewing a single channel will increase the measurement speed if the analyzer’s channels
are in alternate, or uncoupled mode.
1. Press
.
2. Press and to alternately view the two measurement channels.
If you must view both measurement channels simultaneously (with dual channel), use
the chop sweep mode, explained next.
3. If you want to view channel 3 (or channel 4), press (or ). This will
always result in a dual trace display of channel 1 and channel 3 (or channel 2 and
channel 4).
To return to a single-trace display, press
.
To Activate Chop Sweep Mode
You can use the chop sweep mode to make two measurements at the same time. For
example, the analyzer can measure S11 and S21 simultaneously. Y ou can acti vate the chop
mode by pressing or by pressing .
While Chop mode is the fastest way to measure devices, some components, such as filters
with very high attenuation, may require measurement in Alternate mode. See "Increasing
Dynamic Range" on page 5-15.
To Use External Calibration
Off-loading the error correction process to an external PC increases throughput on the
network analyzer. This can be accomplished with remote-only commands. Refer to the
programmer’s guide for information on how to use external calibration.
To Use Fast 2-Port Calibration (ES Analyzers Only)
With a 2-port calibration on, faster trace updates are possible by not measuring the
reverse path for every forward sweep. This is cont r olled by the test set switch command.
This is convenient for tuning applications because it gives a faster trace update.
When making measurements using full two-port error-correction, the following types of
test set switching can be defined by the user:
Hold: In this mode the analyzer does not switch between the test ports on every sweep.
The measurement stays on the active port after an initial cycling between the ports.
The fastest measurements can be made by using this type of test set switching.
Pressing the key, changing to a different S-parameter measurement, or any
other action which restarts a sweep will cause the test set to switch and cycle between
the ports.
Display
DUAL | QUAD SETUP
DUAL CHAN on OFF
AUX CHAN on OFF
Chan 1 Chan 2
Chan 3 Chan 4
Display
DUAL | QUAD SETUP
AUX CHAN on OFF
Preset Cal
MORE
CHOP A and B
Meas