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Making Measurements
Using Limit Lines to Test a Device
Using Limit Lines to Test a Device
Limit testing is a measurement technique that compares measurement data to constraints
that you define. Depending on the results of this comparison, the analyzer will indicate if
your device either passes or fails the test.
Limit testing is implemented by creating individual flat, sloping, and single-point limit
lines on the analyzer display. When combined, these lines can represent the performance
parameters for your device under test. The limit lines created on each measurement
channel are independent of each other.
This example measurement shows you how to test a bandpass filter using the following
procedures:
• creating flat limit lines
• creating sloping limit lines
• creating single point lim it lin es
• editing limit segments
• running a limit test

Setting Up the Measurement Parameters

1. Connect your test device as shown in Figure 1-58.
Figure 1-58 Connections f or SAW Filter Example Measurement
2. Press and choose the measurement settings. For this example the
measurement settings are as follows:
• or on ET models:
•
•
•
You may also want to select settings for the number of data points, power, averaging,
and IF bandwidth.
Preset
Meas
Trans: FWD S21 (B/R)
TRANSMISSN
Center 134 M/µ
Span 50 M/µ
Scale Ref
AUTO SCALE