![9Test](/images/new-backgrounds/24962/2496285x1.webp)
24888 Rev 3.03 - July 12, 2004 |
9Test
The IC includes the following test modes.
Mode | TEST | A_TYPEDET | LDTSTOP# | STRAPL0 | Notes |
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Operational | 0 | X | X | X |
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High impedance | 1 | 0 | 0 | 0 |
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NAND tree | 1 | 0 | 0 | 1 |
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Table 17: Test modes.
9.1High Impedance Mode
In
9.2NAND Tree Mode
There are several NAND trees in the IC. Some of the inputs are differential (e.g., LR[B, A] pins); for these, the _P and _N pairs of signals are converted into a single signal that is part of the NAND tree, as shown in Signal_3 in the following diagram.
VDD |
| … | |
Signal_1 |
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Signal_2 |
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| 1 | ||
Signal_3_P | + | 0 | |
Signal_3_N | - | ||
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… |
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Signal_41 |
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Output signal |
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NAND Tree Mode
to output signal
Figure 5: NAND tree.
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