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HP 1GSa/s Digitizing Oscilloscope 16532A manual Waveform Display, Display Modes

Models: 1GSa/s Digitizing Oscilloscope 16532A

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HP 16532A - General Information

Table 1-2. HP 16532A Operating Characteristics (cont.)

WAVEFORM DISPLAY

Displayed Waveforms:

Eight waveform windows maximum, with scrolling across 96 waveforms.

Display Formats:

Waveforms can be displayed in an overlapping and/or non-overlapping format.

Display capability of A− B and A+ B is also provided.

Display Resolution:

500 points horizontal, 240 points vertical

DISPLAY MODES

Normal (Single):

New acquisition replaces old acquisition on screen.

Accumulate:

New acquisition is displayed in addition to previous acquisitions until screen is erased.

Average:

New acquisitions are averaged with old acquisitions, with the updated waveform displayed until erased. Maximum number of averages is 256.

Overlay:

Up to 8 acquired waveforms from separate channels can be overlayed in the same display area.

Connect-the-dots:

Provides a display of the sample points connected by straight lines.

Waveform Reconstruction:

When there is insufficient data to fill every horizontal location, a post acquisition reconstruction filter fills in missing data points for time base < 50 ns/div.

Waveform Math:

Display capability of A− B and A+ B functions is provided.

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HP 1GSa/s Digitizing Oscilloscope 16532A manual Waveform Display, Display Modes

Contents

HP 16532A Safety Considerations Safety Symbols Contents Section Replaceable Parts ServiceCalibration List of Tables Page Table of Contents Page Module Covered by This Manual Safety RequirementsIntroduction Specifications Accessories SuppliedAccessories Available Operating Characteristics Waveform Record Length 8000 points HP 16532A SpecificationsRise Time2 1.4 ns Vertical dc Gain Accuracy4 ± 1.5% of full scale Timebase HP 16532A Operating CharacteristicsVertical at BNC Trigger Level Range TriggeringDigitizer Trigger Modes Waveform Display Display Modes Measurement Aids Setup Aids Operating Environment Equipment Critical Specifications Recommended Model USE Page Table of Contents Page Module Installation Power RequirementsInitial Inspection Safety Requirements Preparation for Use Installation Considerations Procedure Endplate Overlap Bottom Sequence Storage Tagging for ServiceOperating Environment Packaging Table of Contents Page Performance Test Interval Performance Test ProceduresTest Record DC CAL Output Test AC CAL Output Test Input Resistance SpecificationEquipment Required Critical Specification Model/Part Number Page Voltage Measurement Accuracy Voltage Measurement Accuracy Test Div Offset Supply Upper Limit Lower Limit Procedure Zero-Input Offset Offset Accuracy DC Input Offset Div Offset Supply Min Max Bandwidth V1MHz Time Measurement Accuracy Menu Selection Setting Trigger Sensitivity RUN Repetitive Performance Test Record Paragraph No Test Results Yes No Page Table of Contents Page Maintaining System Integrity Calibration Protection SwitchCalibration Interval Instrument Warmup Calibration Setting the PROTECT/UNPROTECT Switch to Unprotect Location of the PROTECT/UNPROTECT Switch Loading the Default Calibration Factors Equipment Required for Calibration Calibrate Vert Cal of the Self Cal menu as follows Calibrate Delay of the Self Cal menu as followsSelf Cal Menu Calibrations Calibrate the Time Null of the Self Cal menu as follows Calibrate the Logic Trigger of the Self Cal menu as follows Calibrate the Ext Trig Null of the Self Cal menu as follows Ext Trig Null Calibration Connections Setting the PROTECT/UNPROTECT Switch to Protect Sealing the Mainframe Table of Contents Page Ordering Information Replaceable Parts ListAbbreviations Exchange Assemblies Direct Mail Order System Reference Designator and Abbreviations Parts Identification Description Reference DesignatorHP Part Qty Number Mfr Code Mfr Part NumberPage Table of Contents Page Main Assembly Theory of Operation Introduction Safety RequirementsModule Block Diagram and The- ory of Operation Attenuator Theory of Operation HP 16532A Oscilloscope Block Diagram Page Self-Test Access Procedure Self-Tests Load Test System Screen Functional Tests Screen Touch the Functional Tests field A/D Test Run Screen Exit Test System Screen Timebase Test Self-Test DescriptionsData Memory Test Test Troubleshooting Troubleshooting Aids Verifying the System Clock Page 1 6 5 3 2 a Troubleshooting E E TTroubleshooting Sheet Troubleshooting E E T Troubleshooting E E T Troubleshooting E E T Troubleshooting E E T Oscilloscope Module Removal and Replacement Oscilloscope Module Removal Procedure Oscilloscope Module Replacement Procedure 12. Endplate Overlap Bottom Sequence Trigger Cable Removal and Replacement Trigger Cable Removal Procedure Attenuator Removal Procedure Attenuator Removal and ReplacementTrigger Cable Replacement Procedure Attenuator Replacement Procedure Assistance WarrantyCertification