Operation of the slide overlay device

Slide overlay device

The slide overlay device is used for reflecting measurement and comparison patterns, μm marks, marker arrow, company logo and quality data etc. into the microscope image so they appear on the photograph.

Slides with the following line patterns are available:

Marker arrow Measurement

scale 10 mm = 100 divisions

μm marks for 2.5x – 100x objectives 10 x 10 mm grid division

You can make your own masks with any meas- urement and comparison line patterns, quality data, company logos, etc.

The original master has to be copied on a 35 mm negative, i. e. white line patterns on a dark back- ground, preferably using fine-grain document film, and then framed in a customary 50 x 50 mm slide frame.

The original is imaged 2Ê :Ê 1 in the intermediate image plane of the microscope. A distance of e. g. 5 mm in the slide overlay is enlarged to 10 mm in the intermediate image plane of the microscope.

The overlay is only possible in beamsplitter position 50/50 (switch rod) in the middle position of the tube (FSA 25 PE).

The framed slide is inserted in the fitted slide holder (74.6), with the lettering on the white side of the slide facing the lamp.

The slide holder can be adjusted on all sides, so that the overlay can be positioned anywhere in the microscope image. Remember that when you move the slide, the overlay in the image will move in the opposite direction. This takes a bit of getting used to.

The white line pattern can be given a coloured background by inserting 32 mm colour filters in the filter slot (74.7).

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Leica DM IRB manual Operation of the slide overlay device, Slide overlay device, Scale 10 mm = 100 divisions