Texas Instruments MSC1210 manual Ratiometric Measurements, ADC Result + V REF, PT100

Models: MSC1210

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Ratiometric Measurements

12.16 Ratiometric Measurements

Ratiometric measurements may be used to eliminate potential inaccuracy from the ADC process. Ratiometric measurements are obtained in a circuit similar to the one shown in Figure 12−6, where the same source used to drive the reference voltage (VREF) is used to drive the ADC (−IN). This allows measurements to be taken without the accuracy of the voltage of VREF being a factor in the measurement or in potential errors because the ratio between the –IN and –VREFwill be constant, regardless of the accuracy of the voltage of +IN.

Figure 12−6. Circuit Drawing

The voltage measured is a ratio of the resistances RREF and PT100 because the same current flows through the sense element (PT100) and the reference resistor

(RREF). Any errors in IOUT1 do not enter into the accuracy of the measurment be- cause, as shown in the following equations, IOUT is effectively cancelled out:

VIN + PT100 @ IOUT

VREF + RREF @ IOUT

 

VIN

 

ADC Result + VREF

 

￿PT100 @ IOUT￿

PT100

ADC Result + ￿RREF @ IOUT￿

+ RREF

This eliminates both the reference voltage and the current source as sources of accuracy error and is only limited by the accuracy of the reference resistor and performance of the PT100. A high-precision reference resistor is readily obtainable. This is much easier than trying to get the same precision and accu- racy from a voltage reference.

12-24

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Texas Instruments MSC1210 manual Ratiometric Measurements, ADC Result + V REF, PT100, ADC Result + R REF @ I OUT