ADTRAN TSU 120e user manual Run Self-test

Chapter 7. Test Menu

Press Shift+9 to clear results. The results are accumulated until the test pattern is set to NONE or CLEARED.

Using TST DS0s for testing can be very useful, particularly in Fractional T1 applications. You can run an end-to-end test on the Fractional DS0s by:

1.Setting for Map B the TST in the same DS0 as used by Map A to receive data from an Nx/DBU port, and

2.Looping the far end using a V.54 loopback code on the Nx/ DBU port (DBU is TSU 120e only).

In addition, a single DS0 can be used for continuous testing while other DS0s are passing normal data. This will also pro- vide an end-to-end check on the entire link. Set each end to send QRSS in TST DS0s (using 1 DS0) and occasionally view the results on the PATTERN RESULT menu selection.

Run Self-test

The self-test checks the integrity of the internal operation of the electronic components by performing memory tests and by sending and verifying data test patterns through all internal interfaces. Although actual user data cannot be passed during these tests, the self-test can be run with the network and DTE interfaces in place and will not disturb any external interface.

The memory portion of the self-test automatically executes upon power-up. A full self-test can be commanded from a front panel menu or from T-WATCH Pro.

In addition to the specified self-tests, background tests are also run on various parts of the internal electronics. These run dur- ing normal operation to confirm continued correct functioning.

This menu selection is used to execute a full internal self-test. The results of the self-tests are displayed in the LCD. Upon invoking the command, the LCD displays SYSTEM SELF-TESTand the test LEDs are illuminated. Test failures are displayed in the LCD window.

61202129L1-1 TSU 120 User Manual 7-7