Operation, administration, and maintenance (OAM) features 2-167

Dual FAD, SPLTEF

In a dual FAD environment, both signal directions (path A and path B) can be monitored at the same time.

In the case of dual FAD, SPLTEF both the A and B paths are interrupted with the input of A path (equipment side) going to the odd TAP input and the output of the odd TAP going the B path (equipment side). The input of B path (facility side) goes to the even TAP input and the output of the even TAP goes to the A path (facility side).

Figure 2-61

Split test access-Dual FAD, SPLTEF

EX1406

A Path

From Aid

To Aid

B Path

 

 

Equipment

 

Facility

side

 

side

 

 

TAP

 

Odd

Even

 

channel

channel

Loss of association and auto recovery

Connections during a test access session are viewed as temporary and revert back to the original connections when a test access loss of association (LOA) occurs. Power failures and a loss of communication between the test access equipment and OPTera Metro 3500 shelf can trigger a test access LOA.

To detect a loss of association with the test access equipment, the OPTera Metro 3500 monitors the time interval between TL1 messages from the test access equipment. If the OPTera Metro 3500 does not detect a TL1 message before the set time-out period, a loss of association is declared and the test access connections are dropped and the original connections are restored.

Note 1: The time-out period can be set between 0 and 900 seconds using the ED-SYS command. The default value is 300 seconds. If the time-out period is set to 0, loss of association is not monitored and therefore never declared.

Note 2: The TL1 command REPT-INITZN is used to release all test access sessions on the network element by removing all test access connections and restoring previous connections.

Planning and Ordering Guide—Part 1 of 2 NTRN10AN Rel 12.1 Standard Iss 1 Apr 2004

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Nortel Networks 3500, NTRN10AN manual Loss of association and auto recovery, Split test access-Dual FAD, Spltef