Nortel Networks 3500, NTRN10AN manual Split test access, Test access-split state

Operation, administration, and maintenance (OAM) features 2-165

Split test access

The split test access is an intrusive, service-affecting operation. The original cross connection is split, with the incoming signal being connected (via TAP) to the test unit receiver and the outgoing signal is fed from the transmitter of test unit. See Figure 2-57.

Figure 2-57

Test access-split state

EX1398

Input	Output
	TAP IN	Test
	TAP Out	Unit

The split test access configurations that are supported include:

•Single Facility Access Digroup, Split Equipment side (Single FAD, SPLTE) see Figure 2-58

•Single Facility Access Digroup, Split Facility side (Single FAD, SPLTF) see Figure 2-59

•Single Facility Access Digroup, Split Equipment input and continue from TAP (Single FAD, SPLTA) see Figure 2-60

•Dual Facility Access Digroup, Split Equipment and Facility sides (Dual FAD, SPLTEF) see Figure 2-61

Note: In Figure 2-58to Figure 2-61“equipment side” and “facility side” shows the direction(s) of the connection under test.

Single FAD, SPLTE and Single FAD SPLTF

In a single FAD environment, only one direction of the signal can be tested at a time.

In the case of Single FAD, SPLTE, both the A and B paths are interrupted with the input of A path-equipment side going to the TAP input and the output to B path-equipment side as shown in Figure 2-58.

Planning and Ordering Guide—Part 1 of 2 NTRN10AN Rel 12.1 Standard Iss 1 Apr 2004