30 Datasheet
Electrical Specifications
Table 2-12. PWRGOOD Input and TAP Signal Group DC Specifications
Symbol Parameter Min Max Unit Notes1, 2
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. All outputs are open drain.
VHYS Input Hysteresis 200 350 mV 3
3. VHYS represents the amount of hysteresis, nominally centered about 0.5 * VTT, for all TAP inputs.
VT+Input low to high
threshold voltage 0.5 * (VTT + VHYS_MIN) 0.5 * (VTT + VHYS_MAX)V 4
4. The VTT referred to in these specifications refers to instantaneous VTT.
VT-Input high to low
threshold voltage 0.5 * (VTT – VHYS_MAX) 0.5 * (VTT – VHYS_MIN)V 4
VOH Output High Voltage N/A VTT V4
IOL Output Low Current - 45 mA 5
5. The maximum output current is based on maximum current handling capability of the buffer and is not specified into the test
load.
ILI Input Leakage Current - ± 200 µA 6
6. Leakage to VSS with land held at VTT.
ILO Output Leakage
Current -± 200µA
6
RON Buffer On Resistance 7 12 Ω
Table 2-13. GTL+ Asynchronous Signal Group DC Specifications
Symbol Parameter Min Max Unit Notes1
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
VIL Input Low Voltage 0.0 VTT/2 – (0.10 * VTT)-
2, 3
2. VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.
3. LINT0/INTR, LINT1/NMI, and FORCEPR# use GTLREF as a reference voltage. For these two signals,
VIH = GTLREF + (0.10 * VTT) and VIL= GTLREF – (0.10 * VTT).
VIH Input High Voltage VTT/2 + (0.10 * VTT)V
TT -3, 4, 5, 6
4. VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.
5. VIH and VOH may experience excursions above VTT.
6. The VTT referred to in these specifications refers to instantaneous VTT.
VOH Output High Voltage 0.90*VTT VTT V5, 6, 7
7. All outputs are open drain.
IOL Output Low Current — VTT/[(0.50*RTT_MIN) +
RON_MIN]A8
8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into the test
load.
ILI Input Leakage Current N/A ± 200 µA 9
9. Leakage to VSS with land held at VTT.
ILO Output Leakage
Current N/A ± 200 µA 10
10. Leakage to VTT with land held at 300 mV.
RON Buffer On Resistance 8 12 Ω