B |
Debugger General Information
Flash Test Configuration Acceptable Entries
Command Input:
FLASH Configuration Data:
Flash Device Test Mask =00000001 ? 0 or 1
Flash Test Starting Block =00000000 ? 0 through F Flash Test Ending Block =0000000F ? 0 through F Save/Restore For PATS Test [Y?N] =Y ? Y or N Fill Data =000000FF ? any byte 00 through FF
Test Data Increment/Decrement Step =00000001? 0, 1, 2, F
FLASH | Flash Memory Tests (DIR) |
TESTS |
|
ERASE | Erase |
FILL | Fill |
PATS | Patterns |
Erase Test
The erase test erases Flash memory according to the current test configuration parameters selecting starting and ending blocks.
Command Input:
177-Diag>flash erase
Flash Fill Test
This test executes on the i28f008sa FLASHFILETM memory devices, each having sixteen 64Kb blocks. On the MVME177 Flash memory is jumper selectable (mapping to begin at $FF800000 or $FFA00000).