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Debugger General Information

Flash Test Configuration Acceptable Entries

Command Input:

177-Diag>cf flash

FLASH Configuration Data:

Flash Device Test Mask =00000001 ? 0 or 1

Flash Test Starting Block =00000000 ? 0 through F Flash Test Ending Block =0000000F ? 0 through F Save/Restore For PATS Test [Y?N] =Y ? Y or N Fill Data =000000FF ? any byte 00 through FF

Test Data Increment/Decrement Step =00000001? 0, 1, 2, F (-1) etc.

177-Bug>sd

177-Diag>he flash

FLASH

Flash Memory Tests (DIR)

TESTS

 

ERASE

Erase

FILL

Fill

PATS

Patterns

Erase Test

The erase test erases Flash memory according to the current test configuration parameters selecting starting and ending blocks.

Command Input:

177-Diag>flash erase

Flash Fill Test

This test executes on the i28f008sa FLASHFILETM memory devices, each having sixteen 64Kb blocks. On the MVME177 Flash memory is jumper selectable (mapping to begin at $FF800000 or $FFA00000).

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Motorola MVME177 manual Flash Test Configuration Acceptable Entries, Erase Test, Flash Fill Test, Diagflash erase